Y5V Dielectric, KGM Series
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
Y5V Specification Limits
-30ºC to +85ºC
Within specified tolerance
Measuring Conditions
Temperature Cycle Chamber
Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
For Cap > 10 μF, 0.5Vrms @ 120Hz
≤ 5.0% for ≥ 50V DC rating
≤ 7.0% for 25V DC rating
≤ 9.0% for 16V DC rating
≤ 12.5% for ≤ 10V DC rating
Dissipation Factor
10,000MΩ or 500MΩ - μF,
Charge device with rated voltage for 120 ± 5 secs
Insulation Resistance
Dielectric Strength
whichever is less
@ room temp/humidity
Charge device with 250% of rated voltage for
1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
No breakdown or visual defects
Appearance
Capacitance
Variation
No defects
Deflection: 2mm
Test Time: 30 seconds
≤ ±30%
Resistance to
Flexure
Stresses
Dissipation
Factor
Meets Initial Values (As Above)
Insulation
Resistance
≥ Initial Value x 0.1
≥ 95% of each terminal should be covered with
Dip device in eutectic solder at 230 ± 5ºC
Solderability
fresh solder
for 5.0 ± 0.5 seconds
Appearance
No defects, <25% leaching of either end terminal
Capacitance
Variation
≤ ±20%
Dip device in eutectic solder at 260ºC for 60
seconds. Store at room temperature for 24 ± 2
hours before measuring electrical properties.
Dissipation
Resistance to
Solder Heat
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Factor
Insulation
Resistance
Dielectric
Meets Initial Values (As Above)
No visual defects
≤ ±20%
Strength
Appearance
Step 1: -30ºC ± 2º
30 ± 3 minutes
Capacitance
Variation
Step 2: Room Temp
≤ 3 minutes
Dissipation
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Step 3: +85ºC ± 2º
30 ± 3 minutes
Thermal Shock
Factor
Insulation
Resistance
Step 4: Room Temp
≤ 3 minutes
Dielectric
Repeat for 5 cycles and measure after
Meets Initial Values (As Above)
No visual defects
≤ ±30%
Strength
24 ±2 hours at room temperature
Appearance
Capacitance
Variation
Dissipation
Factor
Charge device with twice rated voltage in test
chamber set at 85ºC ± 2ºC
for 1000 hours (+48, -0)
≤ Initial Value x 1.5 (See Above)
≥ Initial Value x 0.1 (See Above)
Load Life
Insulation
Resistance
Remove from test chamber and stabilize at room
temperature for 24 ± 2 hours before measuring.
Dielectric
Meets Initial Values (As Above)
No visual defects
≤ ±30%
Strength
Appearance
Capacitance
Variation
Store in a test chamber set at 85ºC ± 2ºC/ 85% ±
5% relative humidity for 1000 hours
Dissipation
(+48, -0) with rated voltage applied.
≤ Initial Value x 1.5 (See above)
≥ Initial Value x 0.1 (See Above)
Meets Initial Values (As Above)
Load
Humidity
Factor
Remove from chamber and stabilize at room
temperature and humidity for
Insulation
Resistance
24 ± 2 hours before measuring.
Dielectric
Strength
The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or available
online at www.kyocera-avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.
2
TDS-SMDMLCC-0046 | Rev 5
surface mount ceramic capacitor products
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