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JAN1N5969D PDF预览

JAN1N5969D

更新时间: 2024-01-03 18:49:07
品牌 Logo 应用领域
CDI-DIODE 测试二极管
页数 文件大小 规格书
26页 186K
描述
Zener Diode, 6.2V V(Z), 1%, 5W, Silicon, Unidirectional, HERMETIC SEALED, GLASS PACKAGE-2

JAN1N5969D 技术参数

是否Rohs认证: 不符合生命周期:Active
包装说明:O-LALF-W2针数:2
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8541.10.00.50风险等级:5.39
其他特性:HIGH RELIABILITY外壳连接:ISOLATED
配置:SINGLE二极管元件材料:SILICON
二极管类型:ZENER DIODE最大动态阻抗:1 Ω
JESD-30 代码:O-LALF-W2JESD-609代码:e0
元件数量:1端子数量:2
最高工作温度:175 °C最低工作温度:-65 °C
封装主体材料:GLASS封装形状:ROUND
封装形式:LONG FORM峰值回流温度(摄氏度):NOT SPECIFIED
极性:UNIDIRECTIONAL最大功率耗散:0.5 W
认证状态:Qualified参考标准:MIL-19500/356
标称参考电压:6.2 V子类别:Voltage Reference Diodes
表面贴装:NO技术:ZENER
端子面层:Tin/Lead (Sn/Pb)端子形式:WIRE
端子位置:AXIAL处于峰值回流温度下的最长时间:NOT SPECIFIED
最大电压容差:1%工作测试电流:220 mA
Base Number Matches:1

JAN1N5969D 数据手册

 浏览型号JAN1N5969D的Datasheet PDF文件第2页浏览型号JAN1N5969D的Datasheet PDF文件第3页浏览型号JAN1N5969D的Datasheet PDF文件第4页浏览型号JAN1N5969D的Datasheet PDF文件第5页浏览型号JAN1N5969D的Datasheet PDF文件第6页浏览型号JAN1N5969D的Datasheet PDF文件第7页 
INCH POUND  
The documentation and process conversion  
measures necessary to comply with this revision  
shall be completed by 24 February 2005.  
MIL-PRF-19500/356H  
24 November 2004  
SUPERSEDING  
MIL-PRF-19500/356G  
5 September 2003  
PERFORMANCE SPECIFICATION SHEET  
SEMICONDUCTOR DEVICE, DIODE, SILICON, VOLTAGE REGULATOR,  
TYPES 1N4954 THROUGH 1N4996, 1N5968, 1N5969, AND 1N6632 THROUGH 1N6637,  
1N4954US THROUGH 1N4996US, 1N5968US, 1N5969US, AND 1N6632US THROUGH 1N6637US,  
AND C AND D TOLERANCE SUFFIX DEVICES,  
JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC  
This specification is approved for use by all Departments  
and Agencies of the Department of Defense.  
*
The requirements for acquiring the product described herein shall consist of  
this specification sheet and MIL-PRF-19500.  
1. SCOPE  
1.1 Scope. This specification covers the performance requirements for silicon, voltage regulator diodes. Four  
levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500, and two  
levels of product assurance for each unencapsulated device type die.  
1.2 Physical dimensions. See figures 1 (axial leaded), 2 (surface mount), and 3 (die).  
* 1.3 Maximum ratings. Maximum ratings are as shown in maximum test ratings herein (see 3.10) and as follows:  
PT at  
TL = +65°C  
L = .375 inch  
(9.53 mm)  
1N4954  
PT at  
TL = +25°C  
L = .375 inch (9.53  
mm)  
PT at  
TEC = +125°C  
TJ and TSTG  
Barometric pressure  
reduced (high altitude  
operation)  
1N5968,  
1N5969,  
1N4954US  
through  
1N4954 through  
1N4996  
1N4954 through  
1N4996  
through  
1N4996  
1N6632 through  
1N6637  
1N4996US  
N5968US,  
1N5968,  
1N5969,  
1N5968,  
1N5969,  
1N5969US,  
1N6632US through  
1N6637US  
1N6632 through  
1N6637  
including US suffix  
1N6632 through  
1N6637  
including US suffix  
5 W (1)  
5 W (2)  
5 W (3)  
8 mHg  
-65°C to +175°C  
(1) Derate: See figure 4 herein.  
(2) Derate: See figure 5 herein.  
(3) Derate: See figures 5, 6 and 7 herein.  
* Comments, suggestions, or questions on this document should be addressed to Defense Supply Center,  
Columbus, ATTN: DSCC-VAC, P.O. Box 3990, Columbus, OH 43218-3990, or emailed to  
Semiconductor@dscc.dla.mil. Since contact information can change, you may want to verify the currency of this  
address information using the ASSIST Online database at http://assist.daps.dla.mil..  
AMSC N/A  
FSC 5961.  

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