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ISO7230CQDWRQ1 PDF预览

ISO7230CQDWRQ1

更新时间： 2024-01-21 04:53:51
品牌 Logo 应用领域
德州仪器 - TI 驱动程序和接口接口集成电路光电二极管
页数 文件大小 规格书
23页 804K
描述
HIGH SPEED, TRIPLE DIGITAL ISOLATORS

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中文翻译

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ISO7230CQDWRQ1 技术参数

生命周期：Obsolete零件包装代码：SOIC
包装说明：SOP,针数：16
Reach Compliance Code：unknownHTS代码：8542.39.00.01
风险等级：5.82其他特性：ALSO REQUIRES 4.5V TO 5.5V SUPPLY
接口集成电路类型：INTERFACE CIRCUITJESD-30 代码：R-PDSO-G16
长度：10.3 mm功能数量：3
端子数量：16最高工作温度：125 °C
最低工作温度：-40 °C封装主体材料：PLASTIC/EPOXY
封装代码：SOP封装形状：RECTANGULAR
封装形式：SMALL OUTLINE认证状态：Not Qualified
筛选级别：AEC-Q100座面最大高度：2.65 mm
最大供电电压：3.6 V最小供电电压：3.15 V
标称供电电压：3.3 V表面贴装：YES
温度等级：AUTOMOTIVE端子形式：GULL WING
端子节距：1.27 mm端子位置：DUAL
宽度：7.5 mmBase Number Matches：1

ISO7230CQDWRQ1 数据手册

 浏览型号ISO7230CQDWRQ1的Datasheet PDF文件第2页浏览型号ISO7230CQDWRQ1的Datasheet PDF文件第3页浏览型号ISO7230CQDWRQ1的Datasheet PDF文件第4页浏览型号ISO7230CQDWRQ1的Datasheet PDF文件第5页浏览型号ISO7230CQDWRQ1的Datasheet PDF文件第6页浏览型号ISO7230CQDWRQ1的Datasheet PDF文件第7页 
ISO7230C-Q1  
ISO7231C-Q1  
www.ti.com  
SLLSE71 –SEPTEMBER 2011  
HIGH SPEED, TRIPLE DIGITAL ISOLATORS  
Check for Samples: ISO7230C-Q1, ISO7231C-Q1  
1
FEATURES  
•
Qualified for Automotive Applications  
•
•
High Electromagnetic Immunity  
(See Application Note SLLA181)  
–40°C to 125°C Operating Range  
•
25 and 150-Mbps Signaling Rate Options  
–
–
–
Low Channel-to-Channel Output Skew  
Low Pulse-Width Distortion (PWD)  
Low Jitter Content; 1 ns Typ at 150 Mbps  
•
•
Typical 25-Year Life at Rated Working Voltage  
(See Application Note SLLA197 and Figure 14)  
4000-Vpeak Isolation, 560-Vpeak VIORM  
–
UL 1577, IEC 60747-5-2 (VDE 0884, Rev 2),  
IE 61010-1, IEC 60950-1 and CSA Approved  
•
•
4 kV ESD Protection  
Operate With 3.3-V or 5-V Supplies  
DESCRIPTION  
The ISO7230C-Q1 and ISO7231C-Q1 are triple-channel digital isolators each with multiple channel  
configurations and output enable functions. These devices have logic input and output buffers separated by TI’s  
silicon dioxide (SiO2) isolation barrier. Used in conjunction with isolated power supplies, these devices block high  
voltage, isolate grounds, and prevent noise currents on a data bus or other circuits from entering the local ground  
and interfering with or damaging sensitive circuitry.  
The ISO7230C-Q1 triple-channel device has all three channels in the same direction while the ISO7231C-Q1 has  
two channels in one direction and one channel in opposition. These devices have an active-high output enable  
that when driven to a low level, places the output in a high-impedance state.  
The ISO7230C-Q1 and ISO7231C-Q1 have TTL input thresholds and a noise-filter at the input that prevents  
transient pulses of up to 2 ns in duration from being passed to the output of the device.  
In each device, a periodic update pulse is sent across the isolation barrier to ensure the proper dc level of the  
output. If this dc-refresh pulse is not received, the input is assumed to be unpowered or not being actively driven,  
and the failsafe circuit drives the output to a logic high state. (Contact TI for a logic low failsafe option).  
These devices require two supply voltages of 3.3-V, 5-V, or any combination. All inputs are 5-V tolerant when  
supplied from a 3.3-V supply and all outputs are 4-mA CMOS. These devices are characterized for operation  
over the ambient temperature range of –40°C to 125°C.  
ISO7230  
ISO7231  
DW PACKAGE  
DW PACKAGE  
V
V
V
V
CC2  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
CC1  
CC2  
CC1  
GND1  
GND2  
GND1  
GND2  
IN  
A
IN  
B
IN  
C
OUT  
A
IN  
IN  
OUT  
A
A
B
OUT  
B
OUT  
B
IN  
C
OUT  
C
OUT  
C
NC  
NC  
NC  
NC  
NC  
EN  
EN  
EN  
2
1
GND1  
GND2  
GND1  
GND2  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2011, Texas Instruments Incorporated  
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