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HS-2420EH PDF预览

HS-2420EH

更新时间: 2024-09-29 14:57:51
品牌 Logo 应用领域
瑞萨 - RENESAS /
页数 文件大小 规格书
11页 447K
描述
Radiation Hardened Fast Sample and Hold

HS-2420EH 数据手册

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DATASHEET  
HS-2420EH  
Radiation Hardened Fast Sample and Hold  
FN8727  
Rev 0.00  
March 17, 2015  
The HS-2420EH is a radiation hardened monolithic circuit  
consisting of a high performance operational amplifier with its  
output in series with an ultra-low leakage analog switch and a  
MOSFET input unity gain amplifier.  
Features  
• Electrically screened to SMD #5962-95669  
• QML qualified per MIL-PRF-38535 requirements  
With an external hold capacitor connected to the switch  
output, a versatile high performance sample-and-hold or  
track-and-hold circuit is formed. When the switch is closed, the  
device behaves as an operational amplifier and any of the  
standard op amp feedback networks may be connected  
around the device to control gain, frequency response, etc.  
When the switch is opened, the output will remain at its last  
level.  
• Maximum acquisition time  
- 10V Step to 0.1% . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4µs  
- 10V Step to 0.01%. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6µs  
• Maximum drift current . . . . . . . . . . . . . . . . . . . . . . . . . . . 10nA  
(maximum over-temperature)  
• TTL compatible control input  
• Power supply rejection . . . . . . . . . . . . . . . . . . . . . . . . . 80dB  
Performance as a sample-and-hold compares very favorably  
with other monolithic, hybrid, modular and discrete circuits.  
Accuracy to better than 0.01% is achievable over the  
temperature range. Fast acquisition is coupled with superior  
droop characteristics, even at high temperatures. High slew  
rate, wide bandwidth and low acquisition time produce  
excellent dynamic characteristics. The ability to operate at  
gains greater than 1 frequently eliminates the need for  
external scaling amplifiers.  
• Radiation tolerance  
- High dose rate (50 to 300rad(Si)/s) . . . . . . . . 100krad(Si)  
- Low dose rate (0.01rad(Si)/s) . . . . . . . . . . . . 100krad(Si)*  
* Only the EH device is wafer-by-wafer acceptance tested at  
the low dose rate and guaranteed to 50krad(Si). The  
100krad(Si) limit is established by characterization only.  
• No latch-up  
The device may also be used as a versatile operational  
amplifier with a gated output for applications such as analog  
switches, peak holding circuits, etc.  
Applications  
• Data acquisition systems  
• D to A deglitcher  
• Auto zero systems  
• Peak detector  
Specifications for Rad Hard QML devices are controlled by the  
Defense Logistics Agency Land and Maritime (DLA). The SMD  
numbers listed here must be used when ordering.  
Detailed Electrical Specifications for these devices are  
contained in SMD 5962-95669.  
• Gated op amp  
OFFSET  
ADJUST  
V+  
3
4
5
7
1
-
- INPUT  
+ INPUT  
OUTPUT  
-
+
+
2
14  
HS-2420EH  
SAMPLE/  
HOLD  
CONTROL  
13  
GND V-  
5
11  
HOLD  
CAPACITOR  
FIGURE 1. FUNCTIONAL DIAGRAM  
FN8727 Rev 0.00  
March 17, 2015  
Page 1 of 11  

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