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GCH155R71E103KE01# PDF预览

GCH155R71E103KE01#

更新时间: 2023-09-03 20:31:24
品牌 Logo 应用领域
村田 - MURATA 医疗医疗器械
页数 文件大小 规格书
30页 1741K
描述
植入式医疗器械设备或医疗器械设备 [GHTF D]

GCH155R71E103KE01# 数据手册

 浏览型号GCH155R71E103KE01#的Datasheet PDF文件第1页浏览型号GCH155R71E103KE01#的Datasheet PDF文件第3页浏览型号GCH155R71E103KE01#的Datasheet PDF文件第4页浏览型号GCH155R71E103KE01#的Datasheet PDF文件第5页浏览型号GCH155R71E103KE01#的Datasheet PDF文件第6页浏览型号GCH155R71E103KE01#的Datasheet PDF文件第7页 
Specifications and Test Methods  
No Item  
Specification  
Test Method  
-
-
1 Pre-and Post-Stress  
Electrical Test  
Appearance  
Capacitance Change  
Q or D.F.  
No defects or abnormalities.  
Within +/-10%  
DF0.2  
Mounting method  
Pre-treatment  
Solder the capacitor on the test substrate  
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours  
at room temperature, then measure.  
100cycles  
2 Temperature Cycling  
I.R.(Room Temp.)  
More than 50ΩF  
Cycles  
Temperature Cycling  
Post-treatment  
Per EIA-469  
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.  
Appearance  
No defects or abnormalities.  
3 Destructive Physical  
Analysis  
Appearance  
Capacitance Change  
Q or D.F.  
No defects or abnormalities.  
Within +/-12.5%  
DF0.2  
Mounting method  
Pre-treatment  
Solder the capacitor on the test substrate  
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours  
at room temperature, then measure.  
4 Biased Humidity  
I.R.(Room Temp.)  
More than 5ΩF  
Test Temperature  
Test Humidity  
Test Time  
85+/-3℃  
80%RH to 85%RH  
240+/-12h  
Test Voltage  
The rated voltage and 1.3+0.2/-0Vdc (add 6.8kΩ resister)  
Charge/discharge current 50mA max.  
Post-treatment  
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours  
at room temperature, then measure.  
Appearance  
Capacitance Change  
Q or D.F.  
No defects or abnormalities.  
Within +/-12.5%  
DF0.2  
Mounting method  
Pre-treatment  
Solder the capacitor on the test substrate  
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours  
at room temperature, then measure.  
5 Operational Life  
I.R.(Room Temp.)  
More than 5ΩF  
Test Temperature  
Test Time  
Maximum Operating Temperature +/-3℃  
1000+/-12h  
Test Voltage  
150% of the rated voltage  
Charge/discharge current 50mA max.  
Post-treatment  
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours  
at room temperature, then measure.  
No defects or abnormalities.  
Shown in Dimension.  
Visual inspection  
6 Appearance  
7 Dimension  
Using Measuring instrument of dimension.  
Appearance  
Capacitance or Capacitance Change  
No defects or abnormalities.  
Pre-treatment  
Heat treatment:Perform a heat treatment at 150+0/-10°C for 1hour and then let sit for 24+/-2hours  
at room temperature, then measure.  
Solder bath method  
Sn-3.0Ag-0.5Cu(Lead Free Solder)  
260+/-5℃  
10+/-1s  
8 Resistance to Soldering  
Heat  
Capacitance:Within the specified initial value.  
Within the specified initial value.  
More than 50ΩF  
Q or D.F.  
I.R.(Room Temp.)  
Test Method  
Kind of Solder  
Test Temperature  
Test Time  
Post-treatment  
Non treatment:Let sit for 24+/-2hours at room temperature, then measure.  
GCH155R71E103KE01-01B  
2

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