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FTW1608FE6R8MT PDF预览

FTW1608FE6R8MT

更新时间: 2024-03-03 10:09:23
品牌 Logo 应用领域
长江微电 - CJIANG /
页数 文件大小 规格书
10页 1991K
描述
铁氧体绕线

FTW1608FE6R8MT 数据手册

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6. Test and Measurement Procedures  
6.1 Test Conditions  
Unless otherwise specified, the standard atmospheric conditions for measurement/test as:  
a. Ambient Temperature: 20±15℃  
b. Relative Humidity: 65%±20%  
c. Air Pressure: 86 KPa to 106 KPa  
If any doubt on the results, measurements/tests should be made within the following limits:  
a. Ambient Temperature: 20±2℃  
b. Relative Humidity: 65%±5%  
c. Air Pressure: 86KPa to 106 KPa  
6.2 Visual Examination  
a. Inspection Equipment: 30X magnifier  
6.3 Electrical Test  
6.3.1 DC Resistance (DCR)  
a. Refer to Item 5.  
b. Test equipment: HIOKI3540 or equivalent.  
6.3.2 Inductance (L)  
a. Refer to Item 5.  
b. Test equipment: Agilent4287A+Agilent16197A or equivalent.  
c. Test signal: -13dBm or 10mA  
d. Test frequency refers to Item 3.  
6.3.3 Q Factor (Q)  
a. Refer to Item 5.  
b. Test equipment: Agilent4287A+Agilent16197A or equivalent.  
c. Test signal: -13dBm or 10mA  
d. Test frequency refers to Item 5.  
6.3.4 Self-Resonant Frequency (SRF)  
a. Refer to Item 5.  
b. Test equipment: Agilent4991B+Agilent16197A and HP 8753E or equivalent.  
c. Test signal: -20dBm or 50mV  
6.3.5 Saturation Current (IDC)  
a. Refer to Item 5.  
b. Test equipment : Electric Power, Electric current meter, Agilent4991A+Agilent16197A or equivalent.  
c. Measurement method :  
1. Set test current to be 0 mA.  
2. Measure initial chip inductance.  
3. Gradually increase voltage and measure chip inductance for corresponding current.  
d. Definition of Saturation Current (IDC): IDC is direct electric current as chip inductance drop just 10% from its value  
without current.  
6.3.6 Rated Current (Irms)  
e. Refer to Item 5.  
f.  
Test equipment (see Fig.6.3.4-1): Electric Power, Electric current meter, Thermometer.  
g. Measurement method (see Fig. 6.3.4-1):  
1. Set test current to be 0 mA.  
2. Measure initial temperature of chip surface.  
3. Gradually increase voltage and measure chip temperature for corresponding current.  
h. Definition of Rated Current (Irms): Irms is direct electric current as chip surface temperature rose just 15against  
chip initial surface temperature (Ta) (see Fig. 6.3.4-2).  
Ta+15  
Ta  
0
Rated current  
Irms (mA)  
Fig. 6.3.4-2  
Fig. 6.3.4-1  
Specifications subject to change without notice. Please check our website for latest informations.  
WWW.CJIANG.TW  

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