WIRE WOUND CHIP INDUCTORS
①外观无可见损伤痕迹;
No visible mechanical damage.
②感量变化不超过±5%;
Inductance shall not change more than
±5%;
①FHD-UC 系列产品放置于温度-55±2℃的环境中存放
+24
-0
耐低温
Low temperature
resistance
1000
h
5
6
7
8
FHD-UC series shall be subjected to-55±2℃ for 1000
+24
-0
③Q 值变化不超过±10%。
Q shall not change more than±10%.
①外观无可见损伤痕迹;
No visible mechanical damage.
②感量变化不超过±5%;
Inductance shall not change more than
±5%;
h
①FHD-UC 系列产品放置于温度+125±5℃的环境中存放
+24
-0
1000
h
耐高温
High temperature
resistance
FHD-UC series shall be subjected to +125±5℃ for1000
+24
-0
h
③Q 值变化不超过±10%。
Q shall not change more than±10%.
①外观无可见损伤痕迹;
No visible mechanical damage.
②感量变化不超过±5%;
Inductance shall not change more than
±5%;
①FHD-UC 系列: +125℃ 30 分钟 ←→ -40℃ 30 分钟,
循环 100 次;
温度冲击
Temperature Shock
FHD-UC series :+125℃ 30minutes ←→ -40℃
30minutes 100 Cycles.
③Q 值变化不超过±10%。
Q shall not change more than±10%.
①外观无可见损伤痕迹;
No visible mechanical damage.
②感量变化不超过±5%;
Inductance shall not change more than
±5%;
①FHD-UC 系列产品加额定电流在 125±2℃温度条件下存
+24
-0
放 1000
h
高温负载
+24
-0
FHD-UC series shall be store at 125±2℃ for 1000
h
High temperature load
with rated current applied.
③Q 值变化不超过±10%。
Q shall not change more than±10%.
①外观无可见损伤痕迹;
No visible mechanical damage.
②感量变化不超过±5%;
Inductance shall not change more than
±5%;
将电感器放置在于湿度 90%~95%,温度 60±2℃的环境中
+24
-0
存放 1000
h
恒定湿热
9
Static Humidity
Inductors shall be subjected to 90%~95%RH. at 60±2℃
+24
-0
③Q 值变化不超过±10%。
Q shall not change more than±10%.
for 1000
h
①将电感器安装于试验基板上;在垂直方向施加力(如下图
所 示) 。Install the inductor on the test substrate; Apply force
in the vertical direction (as shown below).
抗弯强度
Bending
strength
外观无可见损伤痕迹;
10
No visible mechanical damage.
②该板应在(1±0.5) mm/s 的弯曲速率向下弯曲(2±0.2)
mm,保持时间(20±1)s。The epoxy plate should bend
down to (2±0.2) mm at the bending rate of (1±0.5)
6