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CY7C1648KV18-400BZXC PDF预览

CY7C1648KV18-400BZXC

更新时间: 2023-12-06 20:13:04
品牌 Logo 应用领域
英飞凌 - INFINEON 双倍数据速率
页数 文件大小 规格书
29页 777K
描述
DDR-II+ CIO

CY7C1648KV18-400BZXC 数据手册

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CY7C1648KV18  
CY7C1650KV18  
144-Mbit DDR II+ SRAM Two-Word Burst  
Architecture (2.0 Cycle Read Latency)  
144-Mbit DDR II+ SRAM Two-Word Burst Architecture (2.0 Cycle Read Latency)  
Phase locked loop (PLL) for accurate data placement  
Configurations  
Features  
144-Mbit density (8 M × 18, 4 M × 36)  
450-MHz clock for high bandwidth  
With Read Cycle Latency of 2.0 cycles:  
Two-word burst for reducing address bus frequency  
CY7C1648KV18 – 8 M × 18  
CY7C1650KV18 – 4 M × 36  
Double data rate (DDR) interfaces (data transferred at  
900 MHz) at 450 MHz  
Functional Description  
Available in 2.0-clock cycle latency  
The CY7C1648KV18, and CY7C1650KV18 are 1.8-V  
synchronous pipelined SRAMs equipped with DDR II+  
architecture. The DDR II+ consists of an SRAM core with  
advanced synchronous peripheral circuitry. Addresses for read  
and write are latched on alternate rising edges of the input (K)  
clock. Write data is registered on the rising edges of both K and  
K. Read data is driven on the rising edges of K and K. Each  
address location is associated with two18-bit words  
(CY7C1648KV18), or 36-bit words (CY7C1650KV18) that burst  
sequentially into or out of the device.  
Two input clocks (K and K) for precise DDR timing  
SRAM uses rising edges only  
Echo clocks (CQ and CQ) simplify data capture in high-speed  
systems  
Data valid pin (QVLD) to indicate valid data on the output  
Synchronous internally self-timed writes  
DDR II+ operates with 2.0-cycle read latency when DOFF is  
asserted high  
Asynchronous inputs include an output impedance matching  
input (ZQ). Synchronous data outputs (Q, sharing the same  
physical pins as the data inputs D) are tightly matched to the two  
output echo clocks CQ/CQ, eliminating the need for separately  
capturing data from each individual DDR SRAM in the system  
design.  
Operates similar to DDR I device with one cycle read latency  
when DOFF is asserted low  
[1]  
Core VDD = 1.8 V ± 0.1 V; I/O VDDQ = 1.4 V to VDD  
Supports both 1.5 V and 1.8 V I/O supply  
All synchronous inputs pass through input registers controlled by  
the K or K input clocks. All data outputs pass through output  
registers controlled by the K or K input clocks. Writes are  
conducted with on-chip synchronous self-timed write circuitry.  
High-speed transceiver logic (HSTL) inputs and variable drive  
HSTL output buffers  
Available in 165-ball fine-pitch ball grid array (FBGA) package  
(15 ×17 ×1.4 mm)  
For a complete list of related documentation, click here.  
Offered in both Pb-free and non Pb-free packages  
JTAG 1149.1 compatible test access port  
Selection Guide  
Description  
Maximum operating frequency  
450 MHz  
450  
400 MHz Unit  
400  
730  
900  
MHz  
mA  
Maximum operating current  
× 18 Not Offered  
× 36  
980  
Note  
1. The Cypress QDR II+ devices surpass the QDR consortium specification and can support V  
= 1.4 V to V  
.
DDQ  
DD  
Cypress Semiconductor Corporation  
Document Number: 001-44061 Rev. *L  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised January 4, 2018  

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