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CS62LS4008FC PDF预览

CS62LS4008FC

更新时间: 2024-02-24 23:10:10
品牌 Logo 应用领域
其他 - ETC 静态存储器
页数 文件大小 规格书
11页 484K
描述
Low Power CMOS SRAM 512K X 8 Bits

CS62LS4008FC 数据手册

 浏览型号CS62LS4008FC的Datasheet PDF文件第4页浏览型号CS62LS4008FC的Datasheet PDF文件第5页浏览型号CS62LS4008FC的Datasheet PDF文件第6页浏览型号CS62LS4008FC的Datasheet PDF文件第8页浏览型号CS62LS4008FC的Datasheet PDF文件第9页浏览型号CS62LS4008FC的Datasheet PDF文件第10页 
Low Power CMOS SRAM  
512K X 8 Bits  
UC62LS4008  
-20/-25  
WRITE CYCLE2(1,6)  
tWC  
ADDRESS  
CE  
tAW  
(11)  
(2)  
tCW  
tAS  
tWP  
WE  
tWHZ  
tOH  
DOUT  
(7)  
(8)  
tDW  
tDH  
DIN  
NOTES:  
1. WE\ must be high during address transitions.  
2. The internal write time of the memory is defined by the overlap of CE\ and WE\ low. All signals  
must be active to initiate a write and any one can terminate a write by going inactive. The data  
input setup and hold timing should be referenced to the second transition edge of the signal that  
terminates the write.  
3. TWR is measured from the earlier of CE\ or WE\ going high at the end of write cycle.  
4. During this period, DQ pins are in the output state so that the input signals of opposite phase to  
the outputs must not be applied.  
5. If the CE\ low transition occurs simultaneously with the WE\ low transitions or after the WE\  
transition, output remain in a high impedance state.  
6. OE\ is continuously low (OE\ = VIL).  
7. DOUT is the same phase of write data of this write cycle.  
8. DOUT is the read data of next address.  
9. If CE\ is low during this period, DQ pins are in the output state. Then the data input signals of  
opposite phase to the outputs must not be applied to them.  
10. Transition is measured 500mV from steady state with CL = 5pF as shown in Figure 1B. The  
parameter is guaranteed but not 100% tested.  
11. TCW is measured from the later of CE\ going low to the end of write.  
U-Chip Technology Corp. LTD. .  
Preliminary Rev.1.0  
Reserves the right to modify document contents without notice.  
PAGE 7  

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