MULTILAVER CHIP FERRITE BEADS
◆可靠性测试方法
Reliability Test Method
序号
项目
要求
试验方法及备注
No.
Items
Requirements
Test Methods and Remarks
温度125℃;
不通电;
持续时间1000h;
无可见损伤;
周期测试250h,500h;
试验结束后 (24±4)h 内进行电性能测量。
Temperature 125℃;
高温存储
阻抗:△Z/Z ≤ ±30%。
No Visible damage;
1
High Temperature
Exposure (Storage)
Impedance:△Z/Z≤ ±30%
Unpowered;
Duration 1000h;
Examination at 250h ,500h and 1000h;
Measurement at (24±4) hours after test conclusion.
高温125℃;低温-40℃;
高、低温下暴露时间各30分钟;
转换时间≤1min;
循环次数1000次。
无可见损伤;
温度循环
Temperature
Cycling
试验结束后24±4小时内进行测试。
High Temperature +125℃;low temperature -40℃;
Duration at each temperature 30 min;
Transition time ≤ 1 min.
阻抗:△Z/Z ≤ ±30%。
No Visible damage;
Impedance:△Z/Z ≤±30%
2
Severity 1000 cycles;
Measurement at 24±4 hours after test
conclusion.
温度85℃;湿度85RH%;
持续时间1000小时,不通电。周期测量250小时、500小时。
试验结束后24±4小时内进行测试。
无可见损伤;
偏高湿度(高温高湿) 阻抗:△Z/Z ≤±30%。
3
Temperature 85℃;Relative humidity 85%;
Duration 1000 h; Unpowered. Examination at 250h ,500h
and 1000h;
Biased Humidity
No Visible damage;
Impedance:△Z/Z ≤ ±30%
Measurement at 24±4 hours after test conclusion.
温度125℃;
施加电流:常温额定电流的1/2;
持续时间:1000小时。
无可见损伤;
工作寿命
阻抗:△Z/Z ≤ ±30%。
No Visible damage;
Impedance:△Z/Z ≤±30%
试验结束后24±4小时内进行测试。
Temperature 125℃;
4
Operational Life
Test current: half of Rated current at normal temperature;
Duration 1000 h;
Measurement at 24±4 hours after test conclusion.
正半弦波;
峰值加速度100g;
脉冲持续时间6ms;
无可见损伤;
三轴六向各 3 次,共 18 次。
Half sine wave.
机械冲击
阻抗:△Z/Z≤ ±30%。
No Visible damage;
Impedance:△Z/Z ≤±30%
5
Mechanical Shock
Peak value 100g.
Normal duration 6 ms;
Three shocks in each direction shall be applied along the
three mutually perpendicular axes of the test specimen (18
shocks)
3