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CAT24C021PI-45 PDF预览

CAT24C021PI-45

更新时间： 2024-02-16 22:24:41
品牌 Logo 应用领域
CATALYST 光电二极管外围集成电路
页数 文件大小 规格书
12页 71K
描述
Microprocessor Circuit, CMOS, PDIP8, PLASTIC, DIP-8

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CAT24C021PI-45 技术参数

是否Rohs认证： 不符合生命周期：Obsolete
零件包装代码：DIP包装说明：DIP,
针数：8Reach Compliance Code：unknown
HTS代码：8542.31.00.01风险等级：5.92
JESD-30 代码：R-PDIP-T8JESD-609代码：e0
长度：9.27 mm端子数量：8
最高工作温度：85 °C最低工作温度：-40 °C
封装主体材料：PLASTIC/EPOXY封装代码：DIP
封装形状：RECTANGULAR封装形式：IN-LINE
认证状态：Not Qualified座面最大高度：4.57 mm
最大供电电压：6 V最小供电电压：2.7 V
标称供电电压：5 V表面贴装：NO
技术：CMOS温度等级：INDUSTRIAL
端子面层：Tin/Lead (Sn/Pb)端子形式：THROUGH-HOLE
端子节距：2.54 mm端子位置：DUAL
宽度：7.62 mmuPs/uCs/外围集成电路类型：MICROPROCESSOR CIRCUIT
Base Number Matches：1

CAT24C021PI-45 数据手册

 浏览型号CAT24C021PI-45的Datasheet PDF文件第1页浏览型号CAT24C021PI-45的Datasheet PDF文件第3页浏览型号CAT24C021PI-45的Datasheet PDF文件第4页浏览型号CAT24C021PI-45的Datasheet PDF文件第5页浏览型号CAT24C021PI-45的Datasheet PDF文件第6页浏览型号CAT24C021PI-45的Datasheet PDF文件第7页 
CAT24CXX1/XX2  
PIN FUNCTIONS  
ABSOLUTE MAXIMUM RATINGS  
Pin No. Pin Name Function  
Temperature Under Bias ................. –55°C to +125°C  
Storage Temperature....................... –65°C to +150°C  
1
2
3
DC  
RESET  
WP  
Do Not Connect  
Active Low Reset I/O  
Write Protect  
Voltage on any Pin with  
Respect to Ground(1) ............ –2.0V to +VCC +2.0V  
4
5
6
7
8
GND  
SDA  
Ground  
V
CC with Respect to Ground ............... –2.0V to +7.0V  
Serial Data/Address  
Clock Input  
Package Power Dissipation  
Capability (TA = 25°C) ................................... 1.0W  
SCL  
Lead Soldering Temperature (10 secs) ............ 300°C  
Output Short Circuit Current(2) ........................ 100 mA  
RESET  
VCC  
Active High Reset I/O  
Power Supply  
Stresses above those listed under “Absolute Maximum  
Ratings” may cause permanent damage to the device.  
These are stress ratings only, and functional operation  
of the device at these or any other conditions outside of  
those listed in the operational sections of this specifica-  
tion is not implied. Exposure to any absolute maximum  
rating for extended periods may affect device perfor-  
mance and reliability.  
RELIABILITY CHARACTERISTICS  
Symbol  
Parameter  
Reference Test Method  
Minimum Maximum  
Units  
Cycles/Byte  
Years  
(3)  
NEND  
Endurance  
MIL-STD-883, Test Method 1033 1,000,000  
(3)  
TDR  
Data Retention  
ESD Susceptibility  
Latch-Up  
MIL-STD-883, Test Method 1008  
MIL-STD-883, Test Method 3015  
JEDEC Standard 17  
100  
2000  
100  
(3)  
VZAP  
Volts  
(3)(4)  
ILTH  
mA  
D.C. OPERATING CHARACTERISTICS  
= +2.7V to +6.0V, unless otherwise specified.  
V
CC  
Symbol  
ICC  
Parameter  
Test Conditions  
Minimum Typical Maximum  
Units  
Power Supply Current  
Standby Current  
fSCL = 100 KHz  
3
mA  
ISB  
VCC = 3.3V  
VCC = 5  
40  
50  
µA  
µA  
ILI  
Input Leakage Current  
Output Leakage Current  
Input Low Voltage  
VIN = GND or VCC  
VIN = GND or VCC  
2
µA  
µA  
V
ILO  
VIL  
VIH  
VOL1  
10  
-1  
VCC x 0.3  
VCC + 0.5  
0.4  
Input High Voltage  
VCC X 0.7  
V
Output Low Voltage (SDA) IOL = 3 mA, VCC = 3.0V  
V
Note:  
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC  
voltage on output pins is V +0.5V, which may overshoot to V +2.0V for periods of less than 20 ns.  
CC  
CC  
(2) Output shorted for no more than one second. No more than one output shorted at a time.  
(3) This parameter is tested initially and after a design or process change that affects the parameter.  
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V +1V.  
CC  
Doc. No. 3000, Rev. A  
2
1234567...12

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