BUF634A
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SBOS948D – FEBRUARY 2019 – REVISED SEPTEMBER 2020
7 Specifications
7.1 Absolute Maximum Ratings
Over operating free-air temperature range (unless otherwise noted).(1)
MIN
MAX
40 (±20)
Vs ± 0.5
Continuous
125
UNIT
V
VS = (V+) – (V–)
VIN
Supply voltage
Input voltage
V
Output short-circuit (to ground)
Operating ambient temperature
Junction temperature
Storage temperature
TA
–40
–65
°C
°C
°C
TJ
150
Tstg
150
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
7.2 ESD Ratings
VALUE
±3000
±1000
UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
V(ESD)
Electrostatic discharge
V
Charged device model (CDM), per JEDEC specification JESD22-C101(2)
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
7.3 Recommended Operating Conditions
Over operating free-air temperature range (unless otherwise noted).
MIN
±2.25
–40
NOM
±15
25
MAX
±18
UNIT
V
VS = (V+) – (V–)
TA
Supply voltage
Ambient temperature
125(1)
°C
(1) Limited by RΘJA and TJ,Max for safe operation. See the Output Current section.
7.4 Thermal Information
BUF634A
THERMAL METRIC(1)
D (SOIC)
8 PINS
122.9
55.2
DRB (VSON)
8 PINS
50.5
DDA (HSOIC)
8 PINS
41.3
UNIT
RθJA
Junction-to-ambient thermal resistance
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
RθJC(top)
RθJB
60
57.1
68.4
23.6
17.0
ΨJT
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistance
12.1
1.5
4.6
ΨJB
67.2
23.6
17.0
RθJC(bot)
NA
6.9
5.3
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
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