ADC34RF55
ZHCSTP2 –NOVEMBER 2023
www.ti.com.cn
5 Specifications
5.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)(1)
PARAMETER
Supply voltage range, AVDD18
Supply voltage range, AVDD12
Supply voltage range, CLKVDD
Supply voltage range, DVDD
TEST CONDITIONS
MIN
MAX UNIT
2.1
V
V
–0.3
–0.3
–0.3
–0.3
–0.6
–0.3
–0.3
1.4
1.4
1.4
V
INAP/M, INBP/M, INCP/M, INDP/M
CLKP/M
1.2
VDDCLK + 0.3
AVDD12 + 0.6
Voltage applied to input pins
SYSREFP/M
V
V
GPIO1/2, PDN, RESET, SCLK, SEN, SDIO,
SPISEL
AVDD18 + 0.2
–0.3
Peak RF input power (INAP/M, INBP/M, INCP/M,
INDP/M)
12 dBm
Differential 100 Ω termination.
Junction temperature, TJ
Storage temperature, Tstg
Junction temperature, TJ
Storage temperature, Tstg
115
150
°C
°C
–65
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
5.2 ESD Ratings
VALUE
± 1000
± 500
UNIT
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
Charged device model (CDM), per ANSI/ESDA/JEDEC JS-002(2)
V(ESD)
Electrostatic discharge
V
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
5.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
1.75
NOM
1.8
MAX UNIT
AVDD18
AVDD12
CLKVDD
DVDD
1.8 V analog supply
1.85
1.225
1.225
1.225
85
V
V
1.2 V analog supply
1.175
1.175
1.175
–40
1.2
1.2 V clock supply
1.2
V
1.2 V digital supply
1.2
V
TA
Operating free-air temperature
Operating junction temperature
Maximum Operating Junction Temperature Range
°C
105(1)
TJ
°C
125
(1) Prolonged use above this junction temperature may increase the device failure-in-time (FIT) rate.
Copyright © 2023 Texas Instruments Incorporated
5
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Product Folder Links: ADC34RF55
English Data Sheet: SBAS988