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ADC1061CIWM PDF预览

ADC1061CIWM

更新时间: 2024-01-03 16:31:33
品牌 Logo 应用领域
美国国家半导体 - NSC 转换器光电二极管
页数 文件大小 规格书
11页 323K
描述
10-Bit High-Speed レP-Compatible A/D Converter with Track/Hold Function

ADC1061CIWM 技术参数

生命周期:Obsolete包装说明:DIE,
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:5.8
最长转换时间:1.8 µs转换器类型:ADC, FLASH METHOD
JESD-30 代码:R-XUUC-N20最大线性误差 (EL):0.19%
模拟输入通道数量:1位数:10
功能数量:1端子数量:20
最高工作温度:85 °C最低工作温度:-40 °C
输出位码:BINARY输出格式:PARALLEL, WORD
封装主体材料:UNSPECIFIED封装代码:DIE
封装形状:RECTANGULAR封装形式:UNCASED CHIP
认证状态:Not Qualified采样并保持/跟踪并保持:TRACK
标称供电电压:5 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子形式:NO LEAD端子位置:UPPER
Base Number Matches:1

ADC1061CIWM 数据手册

 浏览型号ADC1061CIWM的Datasheet PDF文件第4页浏览型号ADC1061CIWM的Datasheet PDF文件第5页浏览型号ADC1061CIWM的Datasheet PDF文件第6页浏览型号ADC1061CIWM的Datasheet PDF文件第8页浏览型号ADC1061CIWM的Datasheet PDF文件第9页浏览型号ADC1061CIWM的Datasheet PDF文件第10页 
Functional Description (Continued)  
DS010559-13  
FIGURE 3. Block Diagram of the Modified Half-Flash Converter Architecture  
The remaining four LSBs may now be determined using the  
same sixteen comparators that were used for the first flash  
conversion. The MSB Ladder tap voltage just below the input  
voltage (as determined by the first flash) is subtracted from  
the input voltage and compared with the tap points on the  
sixteen LSB Ladder resistors. The result of this second flash  
conversion is then decoded, and the full 10-bit result is  
latched.  
tive. When S /H goes high, the result of the coarse conver-  
sion is latched and the “fine” conversion begins. After ap-  
proximately 1.2 µs (1.8 µs maximum), INT goes low,  
indicating that the conversion results are latched and can be  
read by pulling RD low. Note that CS must be low to enable  
S /H or RD . CS is internally “ANDed” with the sample and  
read control signals; the input voltage is sampled when CS  
and S /H are low, and is read when CS and RD are low.  
Note that the sixteen comparators used in the first flash con-  
version are reused for the second flash. Thus, the half-flash  
conversion techniques used in the ADC1061 needs only a  
small fraction of the number of comparators that would be re-  
quired for a traditional flash converter, and far fewer than  
would be used in a conventional half-flash approach. This al-  
lows the ADC1061 to perform high-speed conversions with-  
out excessive power drain.  
MODE 2  
In Mode 2, also called “RD mode”, the S /H and RD pins are  
tied together. A conversion is initiated by pulling both pins  
low. The ADC1061 samples the input voltage and causes the  
coarse comparators to become active. An internal timer then  
terminates the coarse conversion and begins the fine con-  
version.  
About 1.8 µs (2.4 µs maximum) after S /H and RD are pulled  
low, INT goes low, indicating that the conversion is complete.  
Approximately 20 ns later the data appearing on the  
TRI-STATE output pins will be valid. Note that data will ap-  
pear on these pins throughout the conversion, but will be  
valid only after INT goes low.  
Applications Information  
1.0 Modes of Operation  
The ADC1061 has two basic digital interface modes. These  
are illustrated in Figure 1 and Figure 2.  
MODE 1  
In this mode, the S /H pin controls the start of conversion.  
S /H is pulled low for a minimum of 250 ns. This causes the  
comparators in the “coarse” flash converter to become ac-  
7
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