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AD8403AN10 PDF预览

AD8403AN10

更新时间: 2024-02-23 13:17:39
品牌 Logo 应用领域
亚德诺 - ADI 转换器电位器数字电位计电阻器光电二极管
页数 文件大小 规格书
20页 497K
描述
1-/2-/4-Channel Digital Potentiometers

AD8403AN10 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Active零件包装代码:DIP
包装说明:DIP,针数:24
Reach Compliance Code:unknown风险等级:5.77
其他特性:IT CAN ALSO OPERATE FROM A 5V NOMINAL SUPPLY标称带宽:0.6 kHz
控制接口:3-WIRE SERIAL转换器类型:DIGITAL POTENTIOMETER
JESD-30 代码:R-PDIP-T24JESD-609代码:e0
长度:31.75 mm湿度敏感等级:NOT APPLICABLE
功能数量:4位置数:256
端子数量:24最高工作温度:125 °C
最低工作温度:-40 °C封装主体材料:PLASTIC/EPOXY
封装代码:DIP封装形状:RECTANGULAR
封装形式:IN-LINE峰值回流温度(摄氏度):NOT APPLICABLE
认证状态:COMMERCIAL电阻定律:LINEAR
最大电阻器端电压:5.5 V最小电阻器端电压:
座面最大高度:5.33 mm标称供电电压:3 V
表面贴装:NO标称温度系数:500 ppm/ °C
温度等级:AUTOMOTIVE端子面层:TIN LEAD
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT APPLICABLE
标称总电阻:10000 Ω宽度:7.62 mm
Base Number Matches:1

AD8403AN10 数据手册

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AD8400/AD8402/AD8403–SPECIFICATIONS  
All VERSIONS  
(VDD = +3 V ؎ 10% or + 5 V ؎ 10%, VA = +VDD, VB = 0 V, –40؇C TA +85؇C unless  
otherwise noted)  
ELECTRICAL CHARACTERISTICS  
Parameter  
Symbol  
Conditions  
Min  
Typ1  
Max  
Units  
SWITCHING CHARACTERISTICS2, 3  
Input Clock Pulse Width  
Data Setup Time  
tCH, tCL  
tDS  
tDH  
Clock Level High or Low  
10  
5
5
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Data Hold Time  
CLK to SDO Propagation Delay4  
CS Setup Time  
tPD  
RL = 1 kto +5 V, CL 20 pF  
1
25  
tCSS  
tCSW  
tRS  
tCSH  
tCS1  
10  
10  
50  
0
CS High Pulse Width  
Reset Pulse Width  
CLK Fall to CS Rise Hold Time  
CS Rise to Clock Rise Setup  
10  
NOTES  
1Typicals represent average readings at +25°C and VDD = +5 V.  
2Guaranteed by design and not subject to production test. Resistor-terminal capacitance tests are measured with 2.5 V bias on the measured terminal. The remaining  
resistor terminals are left open circuit.  
3See timing diagram for location of measured values. All input control voltages are specified with tR = tF = 1 ns (10% to 90% of VDD) and timed from a voltage level  
of 1.6 V. Switching characteristics are measured using VDD = +3 V or +5 V. To avoid false clocking a minimum input logic slew rate of 1 V/µs should be maintained.  
4Propagation Delay depends on value of VDD, RL and CL–see applications text.  
Specifications subject to change without notice.  
tRS  
1
1
0
A1 A0 D7 D6 D5 D4 D3 D2 D1 D0  
SDI  
RS  
0
1
tS  
CLK  
V
DD  
0
V
±1%  
OUT  
V
/2  
DAC REGISTER LOAD  
DD  
±1% ERROR BAND  
1
0
CS  
V
DD  
Figure 1c. Reset Timing Diagram  
ABSOLUTE MAXIMUM RATINGS*  
V
OUT  
0V  
(T = +25°C, unless otherwise noted)  
Figure 1a. Timing Diagram  
A
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +8 V  
VA, VB, VW to GND . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V, VDD  
AX–BX, AX–WX, BX–WX . . . . . . . . . . . . . . . . . . . . . . ±20 mA  
Digital Input and Output Voltage to GND . . . . . . . 0 V, +8 V  
Operating Temperature Range . . . . . . . . . . . . –40°C to +85°C  
Maximum Junction Temperature (TJ max) . . . . . . . . . +150°C  
Storage Temperature . . . . . . . . . . . . . . . . . . –65°C to +150°C  
Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . . . +300°C  
Package Power Dissipation . . . . . . . . . . . . . . (TJ max–TA)/θJA  
Thermal Resistance JA)  
P-DIP (N-14) . . . . . . . . . . . . . . . . . . . . . . . . . . . . +83°C/W  
P-DIP (N-24) . . . . . . . . . . . . . . . . . . . . . . . . . . . . +63°C/W  
SOIC (SO-14) . . . . . . . . . . . . . . . . . . . . . . . . . . . +70°C/W  
SOIC (SOL-24) . . . . . . . . . . . . . . . . . . . . . . . . . +120°C/W  
TSSOP-14 (RU-14) . . . . . . . . . . . . . . . . . . . . . . +180°C/W  
TSSOP-24 (RU-24) . . . . . . . . . . . . . . . . . . . . . . +143°C/W  
1
0
SDI  
(DATA IN)  
Ax OR Dx  
Ax OR Dx  
tDS  
tDH  
1
0
SDO  
(DATA OUT)  
A'x OR D'x  
tPD_MIN  
A'x OR D'x  
tPD_MAX  
tCS1  
tCH  
1
0
1
0
CLK  
tCL  
tCSS  
tCSH  
tCSW  
tS  
CS  
V
DD  
±1 %  
V
OUT  
0V  
±1 % ERROR BAND  
*Stresses above those listed under “Absolute Maximum Ratings” may cause  
permanent damage to the device. This is a stress rating only; functional operation  
of the device at these or any other conditions above those listed in the operational  
sections of this specification is not implied. Exposure to absolute maximum rating  
conditions for extended periods may affect device reliability.  
Figure 1b. Detail Timing Diagram  
CAUTION  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily  
accumulate on the human body and test equipment and can discharge without detection.  
Although the AD8400/AD8402/AD8403 feature proprietary ESD protection circuitry, perma-  
nent damage may occur on devices subjected to high energy electrostatic discharges. Therefore,  
proper ESD precautions are recommended to avoid performance degradation or loss of functionality.  
WARNING!  
ESD SENSITIVE DEVICE  
REV. B  
–5–  

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