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AD678SD

更新时间: 2024-02-02 18:58:17
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亚德诺 - ADI /
页数 文件大小 规格书
14页 310K
描述
12-Bit 200 kSPS Complete Sampling ADC

AD678SD 数据手册

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AD678  
ABSOLUTE MAXIMUM RATINGS*  
12/8  
SC OE EOCEN SYNC  
EOC  
CS  
With  
Respect  
AD678  
Specification  
To  
Min Max  
Units  
CONTROL LOGIC  
VOLTAGE  
REF.  
REF  
OUT  
DB11  
12  
VCC  
VEE  
VCC  
VDD  
AGND  
AGND  
VEE  
DGND  
DGND  
AGND  
DGND  
DGND  
–0.3 +18  
V
V
V
V
V
V
V
V
REF  
IN  
DB2  
–18  
+0.3  
OUTPUT  
REGISTER  
DB1  
(R/L)  
12  
–0.3 +26.4  
CONVERSION  
LOGIC  
12-BIT D/A  
DB0  
(HBE)  
CONVERTER  
0
+7  
AGND  
–1  
VEE  
+1  
VCC  
BIPOFF  
V
V
V
CC  
EE  
DD  
4
AIN, REFIN  
Digital Inputs  
Digital Outputs  
Max Junction  
Temperature  
Operating Temperature  
J and K Grades  
A and B Grades  
S and T Grades  
Storage Temperature  
Lead Temperature  
(10 sec max)  
4-BIT FLASH  
A/D  
CONVERTER  
GAIN  
STAGE  
SAMPLE/  
HOLD  
–0.5 +7  
–0.5 VDD + 0.3  
AIN  
DGND  
AGND  
175  
°C  
Functional Block Diagram  
0
+70  
+85  
+125  
+150  
°C  
°C  
°C  
°C  
–40  
–55  
–65  
+300  
°C  
*Stresses above those listed under Absolute Maximum Ratings may cause perma-  
nent damage to the device. This is a stress rating only; functional operation of the  
device at these or any other conditions above those indicated in the operational  
sections of this specification is not implied. Exposure to absolute maximum rating  
conditions for extended periods may affect device reliability.  
ESD SENSITIVITY  
The AD678 features input protection circuitry consisting of large “distributed” diodes and polysilicon  
series resistors to dissipate both high energy discharges (Human Body Model) and fast, low energy  
pulses (Charged Device Model). Per Method 3015.2 of MIL-STD-883C, the AD678 has been  
classified as a Category 1 device.  
WARNING!  
Proper ESD precautions are strongly recommended to avoid functional damage or performance  
degradation. Charges as high as 4000 volts readily accumulate on the human body and test equipment  
and discharge without detection. Unused devices must be stored in conductive foam or shunts, and  
the foam should be discharged to the destination socket before devices are removed. For further  
information on ESD precautions, refer to Analog Devices’ ESD Prevention Manual.  
ESD SENSITIVE DEVICE  
ORDERING GUIDE  
Model1  
Package  
Temperature Range  
Tested and Specified  
Package Option2  
AD678JN  
AD678KN  
AD678JD  
AD678KD  
AD678AD  
AD678BD  
AD678AJ  
AD678BJ  
AD678SD  
AD678TD  
28-Lead Plastic DIP  
28-Lead Plastic DIP  
28-Lead Ceramic DIP  
28-Lead Ceramic DIP  
28-Lead Ceramic DIP  
28-Lead Ceramic DIP  
44-Lead Ceramic JLCC  
44-Lead Ceramic JLCC  
28-Lead Ceramic DIP  
28-Lead Ceramic DIP  
0°C to +70°C  
AC  
AC + DC  
AC  
AC + DC  
AC  
AC + DC  
AC  
AC + DC  
AC  
N-28  
N-28  
D-28  
D-28  
D-28  
D-28  
J-44  
J-44  
D-28  
D-28  
0°C to +70°C  
0°C to +70°C  
0°C to +70°C  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–40°C to +85°C  
–55°C to +125°C  
–55°C to +125°C  
AC + DC  
NOTES  
1For details on grade and package offerings screened in accordance with MIL-STD-883, refer to Analog Devices Military Products Databook or /883 data sheet.  
2N = Plastic DIP; D = Ceramic DIP; J = J-Leaded Ceramic Chip Carrier.  
REV. C  
5–  

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