AD660
AC PERFORMANCE CHARACTERISTICS (With the exception of Total Harmonic Distortion + Noise and Signal-to-Noise
Ratio, these characteristics are included for design guidance only and are not subject to test. THD+N and SNR are 100% tested.
T
MIN ≤ TA ≤ TMAX, VCC = +15 V, VEE = –15 V, VLL = +5 V except where noted.)
Parameter
Limit
Units
Test Conditions/Comments
Output Settling Time
(Time to ±0.0008% FS
with 2 kΩ, 1000 pF Load)
13
8
10
6
8
2.5
µs max
µs typ
µs typ
µs typ
µs typ
µs typ
20 V Step, TA = +25°C
20 V Step, TA = +25°C
20 V Step, TMIN ≤ TA ≤ TMAX
10 V Step, TA = +25°C
10 V Step, TMIN ≤ TA ≤ TMAX
1 LSB Step, TMIN ≤ TA ≤ TMAX
Total Harmonic Distortion + Noise
A, B, S Grade
A, B, S Grade
0.009
0.056
5.6
% max
% max
% max
0 dB, 990.5 Hz; Sample Rate = 96 kHz; TA = +25°C
–20 dB, 990.5 Hz; Sample Rate = 96 kHz; TA = +25°C
–60 dB, 990.5 Hz; Sample Rate = 96 kHz; TA = +25°C
A, B, S Grade
Signal-to-Noise Ratio
83
15
2
dB min
TA = +25°C
Digital-to-Analog Glitch Impulse
Digital Feedthrough
nV-s typ
nV-s typ
nV/√Hz typ
DAC Alternately Loaded with 8000H and 7FFFH
DAC Alternately Loaded with 0000H and FFFFH; CS High
Measured at VOUT; 20 V Span; Excludes Reference
Output Noise Voltage
120
Density (1 kHz – 1 MHz)
Reference Noise
125
nV/√Hz typ
Measured at REF OUT
Specifications subject to change without notice.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD660 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
PIN CONFIGURATION
ABSOLUTE MAXIMUM RATINGS*
VCC to AGND . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +17.0 V
–V
+V
1
2
24
23
22
21
REF OUT
REF IN
V
V
EE to AGND . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –17.0 V
LL to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
EE
CC
AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±1 V
Digital Inputs (Pins 5 through 23) to DGND . . . . . . –1.0 V to
+7.0 V
SPAN,
BIPOLAR OFFSET
+V
3
LL
V
DGND
4
OUT
REF IN to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±10.5 V
Span/Bipolar Offset to AGND . . . . . . . . . . . . . . . . . . . ±10.5 V
Ref Out, VOUT . . . . . . . Indefinite Short to AGND, DGND,
DB7, 15
DB6, 14
DB5, 13
DB4, 12
DB3, 11
DB2, 10
5
20 AGND
AD660
TOP VIEW
(Not to Scale)
19
18
6
LDAC
CLR
7
V
CC, VEE, and VLL
Power Dissipation (Any Package)
8
17 SER
To +60°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1000 mW
Derates above +60°C . . . . . . . . . . . . . . . . . . . . 8.7 mW/°C
Storage Temperature . . . . . . . . . . . . . . . . . . .–65°C to +150°C
Lead Temperature Range
9
16 HBE
10
15 LBE, UNI/BIP CLEAR
14
DB1, 9, MSB/LSB 11
DB0, 8, SIN 12
CS
(Soldering 10 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . +300°C
13
S
OUT
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in
the operational section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
REV. A
–3–