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AD5252BRU50 PDF预览

AD5252BRU50

更新时间: 2024-02-12 15:16:59
品牌 Logo 应用领域
亚德诺 - ADI 电位器存储
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28页 1181K
描述
Dual 64-and 256-Position I2C Nonvolatile Memory Digital Potentiometers

AD5252BRU50 数据手册

 浏览型号AD5252BRU50的Datasheet PDF文件第4页浏览型号AD5252BRU50的Datasheet PDF文件第5页浏览型号AD5252BRU50的Datasheet PDF文件第6页浏览型号AD5252BRU50的Datasheet PDF文件第8页浏览型号AD5252BRU50的Datasheet PDF文件第9页浏览型号AD5252BRU50的Datasheet PDF文件第10页 
AD5251/AD5252  
INTERFACE TIMING CHARACTERISTICS  
Guaranteed by design, not subject to production test. See Figure 3 for location of measured values. All input control voltages are  
specified with tR = tF = ꢀ.5 ns (10% to 90% of 3 V), and timed from a voltage level of 1.5 V. Switching characteristics are measured  
using both VDD = 3 V and 5 V.  
Table 3. Interface Timing and EEMEM Reliability Characteristics (All Parts).  
Parameter  
Symbol  
Conditions  
Min  
Typ  
Max  
Unit  
INTERFACE TIMING  
SCL Clock Frequency  
tBUF Bus Free Time between STOP and  
START  
fSCL  
t1  
400  
kHz  
µs  
1.3  
tHD;STA Hold Time (Repeated START)  
t2  
After this period, the first clock pulse 0.6  
is generated  
µs  
tLOW Low Period of SCL Clock  
t3  
t4  
t5  
t6  
t7  
t8  
t9  
t10  
1.3  
0.6  
0.6  
0
µs  
µs  
µs  
µs  
ns  
ns  
ns  
µs  
tHIGH High Period of SCL Clock  
tSU;STA Setup Time For START Condition  
tHD;DAT Data Hold Time  
0.9  
tSU;DAT Data Setup Time  
100  
tF Fall Time of Both SDA and SCL Signals  
tR Rise Time of Both SDA and SCL Signals  
tSU;STO Setup Time for STOP Condition  
EEMEM Data Storing Time  
300  
300  
0.6  
tEEMEM_STORE  
tEEMEM_RESTORE1  
26  
300  
ms  
µs  
EEMEM Data Restoring Time at  
Power-On1  
VDD rise time dependent. Measure  
without decoupling capacitors at VDD  
and VSS.  
EEMEM Data Restoring Time Upon  
tEEMEM_RESTORE2  
VDD = 5 V  
300  
540  
µs  
µs  
Restore Command or RESET Operation1  
EEMEM Rewritable Time (delay time after tEEMEM_REWRITE  
Power On or RESET before EEMEM can  
be written)  
FLASH/EE MEMORY RELIABILITY  
Endurance2  
Data Retention3  
100  
kCycles  
Years  
100  
1 During power-up, all outputs preset to midscale before restoring to the final EEMEM contents. RDAC0 has the shortest, whereas RDAC3 has the longest EEMEM data  
restoring time.  
2 Retention lifetime equivalent at junction temperature TJ = 55°C per JEDEC Std. 22, Method A117. Retention lifetime based on an activation energy of 0.6 eV derates  
with junction temperature.  
3 When the part is not in operation, the SDA and SCL pins should be pulled to high. When these pins are pulled to low, the I2C interface at these pins conducts current of  
about 0.8 mA at VDD = 5.5 V and 0.2 mA at VDD = 2.7 V.  
Rev. 0 | Page 7 of 28  
 
 
 
 

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