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A29512AV-90 PDF预览

A29512AV-90

更新时间: 2024-01-14 04:19:19
品牌 Logo 应用领域
联笙电子 - AMICC 内存集成电路光电二极管
页数 文件大小 规格书
31页 295K
描述
64K X 8 Bit CMOS 5.0 Volt-only, Uniform Sector Flash Memory

A29512AV-90 技术参数

是否Rohs认证: 不符合生命周期:Contact Manufacturer
包装说明:TSOP1, TSSOP32,.8,20Reach Compliance Code:unknown
风险等级:5.88最长访问时间:90 ns
命令用户界面:YES数据轮询:YES
JESD-30 代码:R-PDSO-G32长度:18.4 mm
内存密度:524288 bit内存集成电路类型:FLASH
内存宽度:8功能数量:1
部门数/规模:2端子数量:32
字数:65536 words字数代码:64000
工作模式:ASYNCHRONOUS最高工作温度:70 °C
最低工作温度:组织:64KX8
封装主体材料:PLASTIC/EPOXY封装代码:TSOP1
封装等效代码:TSSOP32,.8,20封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE并行/串行:PARALLEL
电源:5 V认证状态:Not Qualified
座面最大高度:1.2 mm部门规模:32K
最大待机电流:0.000005 A子类别:Flash Memories
最大压摆率:0.04 mA最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:CMOS
温度等级:COMMERCIAL端子形式:GULL WING
端子节距:0.5 mm端子位置:DUAL
切换位:YES类型:NOR TYPE
宽度:8 mmBase Number Matches:1

A29512AV-90 数据手册

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A29512A Series  
"Autoselect Mode" and "Autoselect Command Sequence"  
sections for more information.  
ICC2 in the Characteristics table represents the active  
current specification for the write mode. The "AC  
Characteristics" section contains timing specification tables  
and timing diagrams for write operations.  
Requirements for Reading Array Data  
To read array data from the outputs, the system must drive  
the  
and  
pins to VIL.  
is the power control and  
CE  
OE  
CE  
selects the device.  
is the output control and gates  
OE  
array data to the output pins.  
should remain at VIH all  
WE  
the time during read operation. The internal state machine  
is set for reading array data upon device power-up, or after  
a hardware reset. This ensures that no spurious alteration  
of the memory content occurs during the power transition.  
No command is necessary in this mode to obtain array  
data. Standard microprocessor read cycles that assert valid  
addresses on the device address inputs produce valid data  
on the device data outputs. The device remains enabled for  
read access until the command register contents are  
altered.  
Program and Erase Operation Status  
During an erase or program operation, the system may  
check the status of the operation by reading the status bits  
on I/O7 - I/O0. Standard read cycle timings and ICC read  
specifications apply. Refer to "Write Operation Status" for  
more information, and to each AC Characteristics section  
for timing diagrams.  
Standby Mode  
When the system is not reading or writing to the device, it  
can place the device in the standby mode. In this mode,  
current consumption is greatly reduced, and the outputs are  
See "Reading Array Data" for more information. Refer to the  
AC Read Operations table for timing specifications and to  
the Read Operations Timings diagram for the timing  
waveforms, lCC1 in the DC Characteristics table represents  
the active current specification for reading array data.  
placed in the high impedance state, independent of the  
input.  
OE  
The device enters the CMOS standby mode when the  
CE  
Writing Commands/Command Sequences  
is held at VCC ± 0.5V. (Note that this is a more restricted  
voltage range than VIH.) The device enters the TTL standby  
To write a command or command sequence (which  
includes programming data to the device and erasing  
mode when  
is held at VIH. The device requires the  
CE  
sectors of memory), the system must drive  
and  
to  
CE  
WE  
standard access time (tCE) before it is ready to read data.  
If the device is deselected during erasure or programming,  
the device draws active current until the operation is  
completed.  
ICC3 in the DC Characteristics tables represents the standby  
current specification.  
VIL, and  
to VIH. An erase operation can erase one  
OE  
sector, multiple sectors, or the entire device. The Sector  
Address Tables indicate the address range that each sector  
occupies. A "sector address" consists of the address inputs  
required to uniquely select a sector. See the "Command  
Definitions" section for details on erasing a sector or the  
entire chip, or suspending/resuming the erase operation.  
After the system writes the autoselect command sequence,  
the device enters the autoselect mode. The system can  
then read autoselect codes from the internal register (which  
is separate from the memory array) on I/O7 - I/O0. Standard  
read cycle timings apply in this mode. Refer to the  
Output Disable Mode  
When the  
input is at VIH, output from the device is  
OE  
disabled. The output pins are placed in the high impedance  
state.  
PRELIMINARY  
(August, 2002, Version 0.0)  
5
AMIC Technology, Inc.  

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