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A1359_16

更新时间: 2022-02-26 12:20:52
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描述
Factory-Programmed Dual Output Linear Hall Effect Sensor IC With Analog and Pulse Width Modulated Outputs

A1359_16 数据手册

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Factory-Programmed Dual Output Linear Hall Effect Sensor IC  
With Analog and Pulse Width Modulated Outputs  
A1359  
voltage increase is proportional to the magnitude of the magnetic  
field applied. Conversely, the application of a north polarity field  
decreases the output voltage from its quiescent value. For the  
case of the reverse polarity device (A1359LLETR-RP-T), the  
presence of a south-polarity magnetic field perpendicular to the  
branded surface of the package face decreases the output volt-  
age from its quiescent value toward the ground rail. The amount  
of the output voltage decrease is proportional to the magnitude  
of the magnetic field applied. Conversely, the application of a  
north polarity field increases the output voltage from its quiescent  
value. This proportionality is specified as the magnetic sensitiv-  
ity, Sens (mV/G), of the device and is defined as:  
Delay to Clamp A large magnetic input step may cause the  
clamp to overshoot its steady state value. The delay to clamp,  
tCLPVOUT, is defined as the time it takes for the output voltage  
to settle within 1% of its steady state value after initially passing  
through its steady state voltage. This is conceptually the same for  
the PWM output duty cycle settling to the steady state value. (See  
figure 4.)  
Quiescent Voltage Output In the quiescent state (no signifi-  
cant magnetic field: B = 0 G), the analog output, VOUT, is ratio-  
metric to the supply voltage, VCC, throughout the entire operating  
range of VCC. The PWM output, VPWMOUT, by virtue of being a  
% duty-cycle will remain at 50% nominal throughout the entire  
VCC operating range (4.5 to 5.5 V).  
VOUT(BPOS) VOUT(BNEG)  
Sens  
=
(2)  
BPOS – BNEG  
Quiescent Output Drift through Temperature Range Due  
to internal component tolerances and thermal considerations, the  
Quiescent Voltage Output, VOUT(Q) , may drift from its nominal  
value across the operating ambient temperature, TA. For purposes  
of specification, the Quiescent Voltage Output Drift Through  
Temperature Range, VOUT(Q) (mV), is defined as:  
where BPOS and BNEG are two magnetic fields with opposite  
polarities.  
Sensitivity Temperature Coefficient Device sensitivity  
changes as temperature changes, with respect to its programmed  
Sensitivity Temperature Coefficient, TCSENS. TCSENS is pro-  
grammed at 150°C, and calculated relative to the nominal  
sensitivity programming temperature of 25°C. TCSENS (%/°C) is  
defined as:  
VOUT(Q)(TA) VOUT(Q)(25°C)  
VOUT(Q)  
=
(1)  
Sensitivity Assuming the sensitivity of the device is positive  
(Positive Polarity: A1359LLETR-T), the presence of a south-  
polarity magnetic field perpendicular to the branded surface of  
the package face increases the output voltage from its quiescent  
value toward the supply voltage rail. The amount of the output  
   
SensT2 – SensT1  
1
(3)  
   
100%  
TCSENS  
=
×
   
SensT1  
T2–T1  
   
where T1 is the nominal Sens programming temperature of 25°C,  
and T2 is the TCSENS programming temperature of 150°C. The  
ideal value of Sens through the full ambient temperature range,  
SensIDEAL(TA), is defined as:  
Magnetic Input Signal  
(4)  
SensIDEAL(TA)  
Sens × [100% +TCSENS (TA T1)]  
=
VCLP(HIGH)  
T1  
VPWMOUT or VOUT  
tCLPPWM or  
tCLPVOUT  
Sensitivity Drift Due to Package Hysteresis Package  
t1  
t2  
stress and relaxation can cause the device sensitivity at TA = 25°C  
to change during and after temperature cycling. This change in  
sensitivity follows a hysteresis curve. For purposes of specifica-  
t1= time at which output voltage initially  
reaches steady state clamp voltage  
tion, the Sensitivity Drift Due to Package Hysteresis, SensPKG  
is defined as:  
,
t2= time at which output voltage settles to  
within 1% of steady state clamp voltage  
Sens(25°C)2 – Sens(25°C)1  
time (μs)  
(5)  
SensPKG  
100 (%)  
=
×
Sens(25°C)1  
Figure 4. Definition of Delay to Clamp  
Allegro MicroSystems, LLC  
115 Northeast Cutoff  
7
Worcester, Massachusetts 01615-0036 U.S.A.  
1.508.853.5000; www.allegromicro.com  

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