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A1020B-PLG84M PDF预览

A1020B-PLG84M

更新时间: 2022-12-01 19:50:05
品牌 Logo 应用领域
ACTEL
页数 文件大小 规格书
24页 163K
描述
Field Programmable Gate Array, 547 CLBs, 2000 Gates, CMOS, PQCC84, PLASTIC, LCC-84

A1020B-PLG84M 数据手册

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A C T  
1 S e r i e s F P G A s  
A C T 1 A r r a y P e r f o r m a n c e  
source 10 mA at TTL levels. See Electrical Specifications for  
additional I/O buffer specifications.  
T e m p e r a t u r e a n d Vo lt a g e E ffe c t s  
Worst-case delays for ACT 1 arrays are calculated in the same  
manner as for masked array products. A typical delay  
parameter is multiplied by a derating factor to account for  
temperature, voltage, and processing effects. However, in an  
ACT 1 array, temperature and voltage effects are less  
dramatic than with masked devices. The electrical  
characteristics of module interconnections on ACT 1 devices  
remain constant over voltage and temperature fluctuations.  
D e v i c e O r g a n i z a t i o n  
ACT 1 devices consist of a matrix of logic modules arranged in  
rows separated by wiring channels. This array is surrounded  
by a ring of peripheral circuits including I/O buffers,  
testability circuits, and diagnostic probe circuits providing  
real-time diagnostic capability. Between rows of logic  
modules are routing channels containing sets of segmented  
metal tracks with PLICE antifuses. Each channel has 22  
signal tracks. Vertical routing is permitted via 13 vertical  
tracks per logic module column. The resulting network allows  
arbitrary and flexible interconnections between logic  
modules and I/O modules.  
As a result, the total derating factor from typical to  
worst-case for a standard speed ACT 1 array is only 1.19 to 1,  
compared to 2 to 1 for a masked gate array.  
Lo g ic Mo d u le S iz e  
Logic module size also affects performance. A mask  
programmed gate array cell with four transistors usually  
implements only one logic level. In the more complex logic  
module (similar to the complexity of a gate array macro) of  
an ACT 1 array, implementation of multiple logic levels  
within a single module is possible. This eliminates interlevel  
wiring and associated RC delays. The effect is termed “net  
compression.”  
P r o b e P i n  
ACT 1 devices have two independent diagnostic probe pins.  
These pins allow the user to observe any two internal signals  
by entering the appropriate net name in the diagnostic  
software. Signals may be viewed on a logic analyzer using  
Actels Actionprobe® diagnostic tools. The probe pins can  
also be used as user-defined I/Os when debugging is finished.  
O r d e r i n g I n f o r m a t i o n  
A1010  
B
2
PL  
84  
C
Application (Temperature Range)  
C = Commercial (0 to +70°C)  
I
= Industrial (–40 to +85°C)  
M = Military (–55 to +125°C)  
B = MIL-STD-883  
Package Lead Count  
Package Type  
PL = Plastic J-Leaded Chip Carriers  
PQ = Plastic Quad Flatpacks  
CQ = Ceramic Quad Flatpack  
PG = Ceramic Pin Grid Array  
VQ = Very Thin Quad Flatpack  
Speed Grade  
Blank = Standard Speed  
–1  
–2  
–3  
= Approximately 15% faster than Standard  
= Approximately 25% faster than Standard  
= Approximately 35% faster than Standard  
Die Revision  
B = 1.0 micron CMOS Process  
Part Number  
A1010 = 1200 Gates (5 V)  
A1020 = 2000 Gates (5 V)  
A10V10 = 1200 Gates (3.3 V)  
A10V20 = 2000 Gates (3.3 V)  
1 -2 8 5  

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