™
A C T
1 S e r i e s F P G A s
P R A
P r o b e A (O u t p u t )
P i n D e s c r i p t i o n
The Probe A pin is used to output data from any user-defined
design node within the device. This independent diagnostic
pin is used in conjunction with the Probe B pin to allow
real-time diagnostic output of any signal path within the
device. The Probe A pin can be used as a user-defined I/O
when debugging has been completed. The pin’s probe
capabilities can be permanently disabled to protect the
programmed design’s confidentiality. PRA is active when the
MODE pin is HIGH. This pin functions as an I/O when the
MODE pin is LOW.
C LK
C lo c k (In p u t )
TTL Clock input for global clock distribution network. The
Clock input is buffered prior to clocking the logic modules.
This pin can also be used as an I/O.
DC LK
Dia g n o s t ic C lo c k (In p u t )
TTL Clock input for diagnostic probe and device
programming. DCLK is active when the MODE pin is HIGH.
This pin functions as an I/O when the MODE pin is LOW.
G N D
G r o u n d
P R B
P r o b e B (O u t p u t )
Input LOW supply voltage.
The Probe B pin is used to output data from any user-defined
design node within the device. This independent diagnostic
pin is used in conjunction with the Probe A pin to allow
real-time diagnostic output of any signal path within the
device. The Probe B pin can be used as a user-defined I/O
when debugging has been completed. The pin’s probe
capabilities can be permanently disabled to protect the
programmed design’s confidentiality. PRB is active when the
MODE pin is HIGH. This pin functions as an I/O when the
MODE pin is LOW.
I/O
In p u t /O u t p u t (In p u t , O u t p u t )
I/O pin functions as an input, output, three-state, or
bidirectional buffer. Input and output levels are compatible
with standard TTL and CMOS specifications. Unused I/O pins
are automatically driven LOW by the ALS software.
MO DE
Mo d e (In p u t )
The MODE pin controls the use of multifunction pins (DCLK,
PRA, PRB, SDI). When the MODE pin is HIGH, the special
functions are active. When the MODE pin is LOW, the pins
function as I/O. To provide Actionprobe capability, the MODE
pin should be terminated to GND through a 10K resistor so
that the MODE pin can be pulled high when required.
S DI
S e r ia l Da t a In p u t (In p u t )
Serial data input for diagnostic probe and device
programming. SDI is active when the MODE pin is HIGH. This
pin functions as an I/O when the MODE pin is LOW.
N C
N o C o n n e c t io n
This pin is not connected to circuitry within the device.
V
S u p p ly Vo lt a g e
C C
Input HIGH supply voltage.
1
R e c o m m e n d e d O p e r a t i n g C o n d i t i o n s
A b s o l u t e M a x i m u m R a t i n g s
Free air temperature range
Parameter
Commercial Industrial
Military
Units
Symbol Parameter
Limits
Units
Temperature
Range
0 to
+70
–40 to
+85
–55 to
+125
1
°C
2
V
V
DC Supply Voltage
Input Voltage
–0.5 to +7.0
Volts
CC
I
PowerSupply
Tolerance
–0.5 to V +0.5 Volts
CC
±5
±10
±10
%V
CC
V
I
Output Voltage
I/O Sink/Source
–0.5 to V +0.5 Volts
CC
O
Note:
±20
mA
1. Ambient temperature (T ) used for commercial and industrial;
IO
A
3
case temperature (T ) used for military.
Current
C
T
Storage Temperature
–65 to +150
°C
STG
Notes:
1. Stresses beyond those listed under “Absolute Maximum Ratings”
may cause permanent damage to the device. Exposure to
absolute maximum rated conditions for extended periods may
affect device reliability. Device should not be operated outside
the Recommended Operating Conditions.
2. V = V , except during device programming.
PP
CC
3. Device inputs are normally high impedance and draw
extremely low current. However, when input voltage is greater
than V + 0.5 V or less than GND – 0.5 V, the internal protection
CC
diode will be forward biased and can draw excessive current.
1 -2 8 7
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