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74AHCT1G79-Q100 PDF预览

74AHCT1G79-Q100

更新时间: 2022-02-26 11:29:10
品牌 Logo 应用领域
安世 - NEXPERIA /
页数 文件大小 规格书
14页 721K
描述
Single D-type flip-flop; positive-edge trigger

74AHCT1G79-Q100 数据手册

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74AHC1G79-Q100;  
74AHCT1G79-Q100  
Single D-type flip-flop; positive-edge trigger  
Rev. 2 — 23 September 2014  
Product data sheet  
1. General description  
74AHC1G79-Q100 and 74AHCT1G79-Q100 are high-speed Si-gate CMOS devices.  
They provide a single positive-edge triggered D-type flip-flop.  
Information on the data input is transferred to the Q output on the LOW-to-HIGH transition  
of the clock pulse. The D input must be stable one set-up time prior to the LOW-to-HIGH  
clock transition for predictable operation.  
The AHC device has CMOS input switching levels and supply voltage range 2 V to 5.5 V.  
The AHCT device has TTL input switching levels and supply voltage range 4.5 V to 5.5 V.  
This product has been qualified to the Automotive Electronics Council (AEC) standard  
Q100 (Grade 1) and is suitable for use in automotive applications.  
2. Features and benefits  
Automotive product qualification in accordance with AEC-Q100 (Grade 1)  
Specified from 40 C to +85 C and from 40 C to +125 C  
Symmetrical output impedance  
High noise immunity  
Low power dissipation  
Balanced propagation delays  
SOT353-1 and SOT753 package options  
ESD protection:  
MIL-STD-883, method 3015 exceeds 2000 V  
HBM JESD22-A114F exceeds 2000 V  
MM JESD22-A115-A exceeds 200 V (C = 200 pf, R = 0 )  

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