REI Datasheet
SN54104, SN54105, SN74104, SN74105
Gated J-K Master-Slave Flip-Flops
These J-K master-slave flip-flops feature a buffered clock input, direct preset and clear, gated J and
K inputs, and a common JK input. The clock buffer offers typical TTL high noise immunity, low clock-
line loading, and, in most cases, eliminates the need for stringent control of system-clock rise and
fall times. When activated, the direct preset and clear inputs control the state of both the master and
slave flip-flops independent of the clock and synchronous-input states. Gated inputs may be used to
perform a wide variety of control functions without the need for external gates, and the common JK
input simplifies hardware design for applications utilizing a single gate-control source.
Quality Overview
Rochester Electronics
Manufactured Components
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ISO-9001
AS9120 certification
Qualified Manufacturers List (QML) MIL-PRF-38535
Rochester branded components are
manufactured using either die/wafers
purchased from the original suppliers
or Rochester wafers recreated from the
original IP. All recreations are done with
the approval of the OCM.
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Class Q Military
Class V Space Level
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Qualified Suppliers List of Distributors (QSLD)
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Rochester is a critical supplier to DLA and
meets all industry and DLA standards.
Parts are tested using original factory
test programs or Rochester developed
test solutions to guarantee product
meets or exceeds the OCM data sheet.
RochesterElectronics, LLCiscommittedtosupplying
products that satisfy customer expectations for
quality and are equal to those originally supplied by
industry manufacturers.
The original manufacturer’s datasheet accompanying this document reflects the performance
and specifications of the Rochester manufactured version of this device. Rochester Electronics
guarantees the performance of its semiconductor products to the original OEM specifications.
‘Typical’ values are for reference purposes only. Certain minimum or maximum ratings may be
based on product characterization, design, simulation, or sample testing.
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