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5AGXFB3H4F35I3G PDF预览

5AGXFB3H4F35I3G

更新时间: 2024-01-13 14:13:56
品牌 Logo 应用领域
英特尔 - INTEL 可编程逻辑
页数 文件大小 规格书
176页 2025K
描述
Field Programmable Gate Array, PBGA1152, FBGA-1152

5AGXFB3H4F35I3G 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:BGA, BGA1152,34X34,40Reach Compliance Code:compliant
风险等级:5.75JESD-30 代码:S-PBGA-B1152
长度:35 mm可配置逻辑块数量:13688
输入次数:704逻辑单元数量:362000
输出次数:704端子数量:1152
最高工作温度:100 °C最低工作温度:-40 °C
组织:13688 CLBS封装主体材料:PLASTIC/EPOXY
封装代码:BGA封装等效代码:BGA1152,34X34,40
封装形状:SQUARE封装形式:GRID ARRAY
可编程逻辑类型:FIELD PROGRAMMABLE GATE ARRAY座面最大高度:2.7 mm
最大供电电压:1.18 V最小供电电压:1.12 V
标称供电电压:1.15 V表面贴装:YES
温度等级:INDUSTRIAL端子形式:BALL
端子节距:1 mm端子位置:BOTTOM
宽度:35 mmBase Number Matches:1

5AGXFB3H4F35I3G 数据手册

 浏览型号5AGXFB3H4F35I3G的Datasheet PDF文件第1页浏览型号5AGXFB3H4F35I3G的Datasheet PDF文件第2页浏览型号5AGXFB3H4F35I3G的Datasheet PDF文件第3页浏览型号5AGXFB3H4F35I3G的Datasheet PDF文件第5页浏览型号5AGXFB3H4F35I3G的Datasheet PDF文件第6页浏览型号5AGXFB3H4F35I3G的Datasheet PDF文件第7页 
AV-51002 | 2019.04.26  
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1. Arria® V GX, GT, SX, and ST Device Datasheet  
This datasheet describes the electrical characteristics, switching characteristics, configuration specifications, and I/O timing  
for Arria® V devices.  
Arria V devices are offered in commercial and industrial grades. Commercial devices are offered in –C4 (fastest), –C5, and –  
C6 speed grades. Industrial grade devices are offered in the –I3 and –I5 speed grades.  
Related Information  
Arria V Device Overview  
Provides more information about the densities and packages of devices in the Arria V family.  
1.1. Electrical Characteristics  
The following sections describe the operating conditions and power consumption of Arria V devices.  
1.1.1. Operating Conditions  
Arria V devices are rated according to a set of defined parameters. To maintain the highest possible performance and  
reliability of the Arria V devices, you must consider the operating requirements described in this section.  
1.1.1.1. Absolute Maximum Ratings  
This section defines the maximum operating conditions for Arria V devices. The values are based on experiments conducted  
with the devices and theoretical modeling of breakdown and damage mechanisms.  
The functional operation of the device is not implied for these conditions.  
Caution:  
Conditions outside the range listed in the following table may cause permanent damage to the device. Additionally, device  
operation at the absolute maximum ratings for extended periods of time may have adverse effects on the device.  
Intel Corporation. All rights reserved. Agilex, Altera, Arria, Cyclone, Enpirion, Intel, the Intel logo, MAX, Nios, Quartus and Stratix words and logos are trademarks  
of Intel Corporation or its subsidiaries in the U.S. and/or other countries. Intel warrants performance of its FPGA and semiconductor products to current  
specifications in accordance with Intel's standard warranty, but reserves the right to make changes to any products and services at any time without notice. Intel  
assumes no responsibility or liability arising out of the application or use of any information, product, or service described herein except as expressly agreed to in  
writing by Intel. Intel customers are advised to obtain the latest version of device specifications before relying on any published information and before placing  
orders for products or services.  
ISO  
9001:2015  
Registered  
*Other names and brands may be claimed as the property of others.  

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