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5962F1023503K4A PDF预览

5962F1023503K4A

更新时间: 2023-07-15 00:00:00
品牌 Logo 应用领域
英飞凌 - INFINEON /
页数 文件大小 规格书
20页 313K
描述
Regulator,

5962F1023503K4A 数据手册

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TABLE IA. Electrical performance characteristics - Continued.  
Conditions 1/  
Limits  
Group A  
Device  
type  
Test  
Symbol  
-55°C TC +125°C  
Unit  
subgroups  
Min  
Max  
unless otherwise specified  
VIN = 3.3 V, Ramp from VSHDN<0.8  
V to VSHDN >1.2 V, monitor for a  
1% drop below nominal VOUT  
1,2,3  
1
01,03,  
04  
F 3/  
Shutdown Threshold  
“Off”  
VIN = 5.0 V, Ramp from VSHDN<0.8  
V to VSHDN >1.2 V, monitor for a  
1% drop below nominal VOUT  
1,2,3  
1
02,05  
F 3/  
VSHDN  
0.8  
1.2  
V
VIN = 3.3 V, Ramp from VSHDN>1.2  
V to VSHDN <0.8 V, monitor for VOUT  
> 500mV  
1,2,3  
1
01,03,  
04  
F 3/  
Shutdown Threshold  
“On”  
VIN = 5.0 V, Ramp from VSHDN>1.2  
V to VSHDN <0.8 V, monitor for VOUT  
> 500mV  
1,2,3  
02,05  
F 3/  
1
1,2,3  
1
RLOAD > 36 Ohms, VSHDN > 1.2 V,  
VIN 3.3 V  
01,03,  
04  
F 3/  
Output Voltage at  
Shutdown  
VOUT  
-0.1  
0.1  
V
RLOAD > 36 Ohms, VSHDN > 1.2 V,  
VIN 5.0 V  
1,2,3  
1
02,05  
All  
F 3/  
SHDN Pin Leakage  
Current 4/  
ISHDN  
VSHDN = 3.3 V  
1, 2, 3  
1
-10  
-98  
10  
-56  
-30  
15  
µA  
µA  
SHDN Pin Pull-Up  
Current 4/  
ISHDN  
VSHDN = 0.4 V  
All  
2, 3  
-140  
No load  
1, 2, 3  
1, 2, 3  
All  
All  
Quiescent Current 4/  
IQ  
mA  
IO = 3.0 A  
90  
1/ When measured at the junction of the VOUT and Adjust pins for Adjustable (Device Type 01 and 02) or VOUT and  
Sense pins for Fixed (Device Type 03, 04 and 05).  
2/ This parameter tested at a fixed output voltage of Vout=2.5 V using external 1060 Ohm resistor, and test limits of Device type  
04.  
3/ The device that is supplied to this drawing has been characterized and tested through RHA level F at the  
initial qualification per the manufacturer’s approved RHA program. The RHA testing on the hybrid is only repeated when a  
change is made as defined by MIL-PRF-38534, Appendix A. The configuration control guidelines of MIL-PRF-38534,  
Appendix E shall apply. Each active element used in a hybrid manufacturing lot shall be limited to a single wafer and each  
wafer shall be qualified for RHA at element evaluation to the manufacturer’s approved RHA program and MIL-PRF-38534,  
Appendix G.  
4/ Under normal closed-loop operation. Guaranteed by design, but not tested in production or post radiation.  
SIZE  
STANDARD  
5962-10235  
A
MICROCIRCUIT DRAWING  
DLA LAND AND MARITIME  
REVISION LEVEL  
A
SHEET  
COLUMBUS, OHIO 43218-3990  
6
DSCC FORM 2234  
APR 97  

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