5秒后页面跳转
5962-9958602QXC PDF预览

5962-9958602QXC

更新时间: 2024-02-02 17:36:28
品牌 Logo 应用领域
ACTEL 可编程逻辑
页数 文件大小 规格书
217页 1554K
描述
Field Programmable Gate Array, 2880 CLBs, 32000 Gates, 2880-Cell, CMOS, CQFP256, CERAMIC, QFP-256

5962-9958602QXC 技术参数

生命周期:Obsolete包装说明:GQFF,
Reach Compliance Code:unknownECCN代码:3A001.A.2.C
HTS代码:8542.39.00.01风险等级:5.79
其他特性:ALSO OPERATES AT 5V SUPPLYCLB-Max的组合延迟:0.9 ns
JESD-30 代码:S-CQFP-F256JESD-609代码:e4
长度:36 mm可配置逻辑块数量:2880
等效关口数量:32000端子数量:256
最高工作温度:125 °C最低工作温度:-55 °C
组织:2880 CLBS, 32000 GATES封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装代码:GQFF封装形状:SQUARE
封装形式:FLATPACK, GUARD RING可编程逻辑类型:FIELD PROGRAMMABLE GATE ARRAY
认证状态:Qualified筛选级别:MIL-PRF-38535 Class Q
座面最大高度:3.81 mm最大供电电压:3.6 V
最小供电电压:3 V标称供电电压:3.3 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子面层:GOLD
端子形式:FLAT端子节距:0.5 mm
端子位置:QUAD宽度:36 mm
Base Number Matches:1

5962-9958602QXC 数据手册

 浏览型号5962-9958602QXC的Datasheet PDF文件第4页浏览型号5962-9958602QXC的Datasheet PDF文件第5页浏览型号5962-9958602QXC的Datasheet PDF文件第6页浏览型号5962-9958602QXC的Datasheet PDF文件第8页浏览型号5962-9958602QXC的Datasheet PDF文件第9页浏览型号5962-9958602QXC的Datasheet PDF文件第10页 
MIL-PRF-38535K  
CONTENTS  
PARAGRAPH  
PAGE  
A.3.6.6 Country of origin .............................................................................................................................................72  
A.3.6.7 Compliance indicator/certification mark ..........................................................................................................72  
A.3.6.8 Serialization ....................................................................................................................................................72  
A.3.6.9 Marking location and sequence ......................................................................................................................73  
A.3.6.9.1 Beryllium oxide package identifier ...............................................................................................................73  
A.3.6.9.2 Electrostatic discharge (ESD) sensitivity identifier.......................................................................................73  
A.3.6.10 Marking on container ....................................................................................................................................73  
A.3.6.11 Marking option for controlled storage of class level B...................................................................................73  
A.3.6.12 Marking option for qualification or quality conformance inspection (QCI) .....................................................73  
A.3.6.13 Remarking ....................................................................................................................................................74  
A.3.7 Workmanship.....................................................................................................................................................74  
A.3.7.1 Rework provisions ..........................................................................................................................................74  
A.3.7.1.1 Rebonding of monolithic devices .................................................................................................................74  
A.4 VERIFICATION.....................................................................................................................................................75  
A.4.1 Responsibility for inspection ..............................................................................................................................75  
A.4.1.1 Inspection during manufacture........................................................................................................................75  
A.4.1.1.1 Metal package isolation test for class level S devices .................................................................................75  
A.4.1.2 Control and inspection of acquisition sources.................................................................................................75  
A.4.1.3 Control and inspection records .......................................................................................................................75  
A.4.1.4 Government source inspection (GSI)..............................................................................................................75  
A.4.1.5 Manufacturer control over its distributors........................................................................................................75  
A.4.1.6 Distributor inventory, traceability and handling control....................................................................................75  
A.4.2 Solderability.......................................................................................................................................................75  
A.4.3 General inspection conditions............................................................................................................................75  
A.4.3.1 Classification of inspections and tests ............................................................................................................75  
A.4.3.2 Sampling.........................................................................................................................................................76  
A.4.3.2.1 Disposal of samples.....................................................................................................................................76  
A.4.3.2.2 Destructive tests ..........................................................................................................................................76  
A.4.3.2.3 Nondestructive tests ....................................................................................................................................77  
A.4.3.3 Formation of lots.............................................................................................................................................77  
A.4.3.3.1 Resubmission of failed lots ..........................................................................................................................78  
A.4.3.4 Test method deviation.....................................................................................................................................78  
A.4.3.5 Procedure in case of test equipment failure or operator error.........................................................................78  
A.4.3.5.1 Procedure for sample tests..........................................................................................................................78  
A.4.3.5.2 Procedure for screening tests......................................................................................................................78  
A.4.3.5.3 Failure and corrective action reports............................................................................................................78  
A.4.3.6 Electrical test equipment verification...............................................................................................................78  
A.4.3.7 Manufacturer imposed tests............................................................................................................................79  
A.4.4 Qualification procedures....................................................................................................................................79  
A.4.4.1 General...........................................................................................................................................................79  
A.4.4.2 Qualification....................................................................................................................................................79  
A.4.4.2.1 Inspection routine ........................................................................................................................................79  
A.4.4.2.1.1 Sample......................................................................................................................................................79  
A.4.4.2.2 Group A electrical testing.............................................................................................................................79  
A.4.4.2.3 Group B testing............................................................................................................................................79  
A.4.4.2.4 Groups C and D testing ...............................................................................................................................79  
A.4.4.2.5 Group E testing............................................................................................................................................79  
A.4.4.2.6 Approval of other lead finishes.....................................................................................................................80  
A.4.4.2.7 Approval of other lead material....................................................................................................................80  
A.4.4.2.8 Electrostatic discharge (ESD) sensitivity......................................................................................................80  
A.4.5 Quality conformance inspection (QCI)...............................................................................................................80  
A.4.5.1 General...........................................................................................................................................................80  
A.4.5.2 Group A inspection .........................................................................................................................................80  
A.4.5.3 Group B inspection .........................................................................................................................................80  
A.4.5.4 Group C inspection for class level B only........................................................................................................80  
vii  

与5962-9958602QXC相关器件

型号 品牌 描述 获取价格 数据表
5962-9958602QYC MICROSEMI Field Programmable Gate Array, 2880 CLBs, 32000 Gates, CMOS, CQFP208, CERAMIC, QFP-208

获取价格

5962-9958602QYC ACTEL 暂无描述

获取价格

5962-9958603QXX ACTEL Field Programmable Gate Array, 32000 Gates, CMOS, CQFP256, CERAMIC, QFP-256

获取价格

5962-9958603QYC ACTEL Field Programmable Gate Array, 32000 Gates, CMOS, CQFP208, CERAMIC, QFP-208

获取价格

5962-9958901QXX WEDC IC LIQUID CRYSTAL DISPLAY DRIVER, UUC464, TCP-464, Display Driver

获取价格

5962-9959001QXC WEDC Liquid Crystal Driver, 200-Segment, CMOS, TCP-200

获取价格