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5962-8753102YB PDF预览

5962-8753102YB

更新时间: 2023-01-03 03:37:25
品牌 Logo 应用领域
TEMIC 先进先出芯片
页数 文件大小 规格书
17页 128K
描述
IC OTHER FIFO, 50 ns, CQCC32, CERAMIC, LCC-32, FIFO

5962-8753102YB 数据手册

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2. APPLICABLE DOCUMENTS  
2.1 Government specification, standards, and handbooks. The following specification, standards and handbooks form a part  
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the  
issue listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto,  
cited in the solicitation.  
SPECIFICATION  
DEPARTMENT OF DEFENSE  
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.  
STANDARDS  
DEPARTMENT OF DEFENSE  
MIL-STD-883 - Test Method Standard Microcircuits.  
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.  
HANDBOOKS  
DEPARTMENT OF DEFENSE  
MIL-HDBK-103 - List of Standard Microcircuit Drawings (SMD's).  
MIL-HDBK-780 - Standard Microcircuit Drawings.  
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization  
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)  
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the  
text of this drawing shall take precedence. Nothing in this document, however, supersedes applicable laws and regulations  
unless a specific exemption has been obtained.  
3. REQUIREMENTS  
3.1 Item requirements The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-  
JAN class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer  
Listing (QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-  
38535 may be processed as QML product in accordance with the manufacturer's approved program plan and qualifying activity  
approval in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make  
modifications to the requirements herein. These modifications shall not affect the PIN as described herein. A "Q" or "QML"  
certification mark in accordance with MIL-PRF-38535 is required to identify when the QML flow option is used.  
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified  
in MIL-PRF-38535, appendix A and herein.  
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.2 herein.  
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.  
3.2.3 Truth table. The truth table shall be as specified on figure 2.  
3.2.4 Die overcoat. Polyimide and silicone coatings are allowable as an overcoat on the die for alpha particle protection  
provided that each coated microcircuit inspection lot (see MIL-PRF-38535, appendix A) shall be subjected to and pass the  
Internal Water-Vapor Content test (test method 1018 of MIL-STD-883). The frequency of the internal water vapor testing may  
not be decreased unless approved by the preparing activity.  
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are  
as specified in table I and shall apply over the full case operating temperature range.  
SIZE  
STANDARD  
5962-87531  
A
MICROCIRCUIT DRAWING  
REVISION LEVEL  
C
SHEET  
DEFENSE SUPPLY CENTER COLUMBUS  
COLUMBUS, OHIO 43216-5000  
3
DSCC FORM 2234  
APR 97  

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