Datasheet > 54ACTQ841LCQR

54ACTQ841LCQR

更新时间： 2024-01-08 00:32:49

品牌	Logo	应用领域
德州仪器 - TI		驱动输出元件逻辑集成电路
页数	文件大小	规格书
10页	184K
描述
ACT SERIES, 10-BIT DRIVER, TRUE OUTPUT, CQCC28, CERAMIC, LCC-28

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54ACTQ841LCQR 技术参数

生命周期：	Obsolete	包装说明：	QCCN,
Reach Compliance Code：	unknown	风险等级：	5.74
系列：	ACT	JESD-30 代码：	S-CQCC-N28
长度：	11.43 mm	逻辑集成电路类型：	BUS DRIVER
位数：	10	功能数量：	1
端口数量：	2	端子数量：	28
最高工作温度：	125 °C	最低工作温度：	-55 °C
输出特性：	3-STATE	输出极性：	TRUE
封装主体材料：	CERAMIC, METAL-SEALED COFIRED	封装代码：	QCCN
封装形状：	SQUARE	封装形式：	CHIP CARRIER
传播延迟（tpd）：	11 ns	认证状态：	Not Qualified
座面最大高度：	1.905 mm	最大供电电压 (Vsup)：	5.5 V
最小供电电压 (Vsup)：	4.5 V	标称供电电压 (Vsup)：	5 V
表面贴装：	YES	技术：	CMOS
温度等级：	MILITARY	端子形式：	NO LEAD
端子节距：	1.27 mm	端子位置：	QUAD
宽度：	11.43 mm	Base Number Matches：	1

54ACTQ841LCQR 数据手册

FACT Noise Characteristics

The setup of a noise characteristics measurement is critical

to the accuracy and repeatability of the tests. The following

is a brief description of the setup used to measure the noise

characteristics of FACT.

6. Set the word generator input levels at 0V LOW and 3V

HIGH for ACT devices and 0V LOW and 5V HIGH for AC

devices. Verify levels with a digital volt meter.

V /V

OLP OLV

and V

/V :

OHP OHV

Equipment:

Determine the quiet output pin that demonstrates the

greatest noise levels. The worst case pin will usually be

the furthest from the ground pin. Monitor the output volt-

ages using a 50X coaxial cable plugged into a standard

SMB type connector on the test fixture. Do not use an

active FET probe.

Hewlett Packard Model 8180A Word Generator

PC-163A Test Fixture

Tektronics Model 7854 Oscilloscope

Procedure:

1. Verify Test Fixture Loading: Standard Load 50 pF, 500X.

Measure V

and V

OLV

on the quiet output during the

and V on the quiet out-

OLP

HL transition. Measure V

2. Deskew the word generator so that no two channels have

greater than 150 ps skew between them. This requires

that the oscilloscope be deskewed first. Swap out the

channels that have more than 150 ps of skew until all

channels being used are within 150 ps. It is important to

deskew the word generator channels before testing. This

will ensure that the outputs switch simultaneously.

OHP

put during the LH transition.

OHV

Verify that the GND reference recorded on the oscillo-

scope has not drifted to ensure the accuracy and repeat-

ability of the measurements.

and V

IHD

ILD

3. Terminate all inputs and outputs to ensure proper loading

of the outputs and that the input levels are at the correct

voltage.

Monitor one of the switching outputs using a 50X coaxial

cable plugged into a standard SMB type connector on

the test fixture. Do not use an active FET probe.

4. Set V

to 5.0V.

First increase the input LOW voltage level, V , until the

output begins to oscillate. Oscillation is defined as noise

5. Set the word generator to toggle all but one output at a

frequency of 1 MHz. Greater frequencies will increase

DUT heating and affect the results of the measurement.

on the output LOW level that exceeds V limits, or on

output HIGH levels that exceed V limits. The input

LOW voltage level at which oscillation occurs is defined

as V

ILD

Next increase the input HIGH voltage level on the word

generator, V until the output begins to oscillate. Oscilla-

tion is defined as noise on the output LOW level that

exceeds V limits, or on output HIGH levels that exceed

limits. The input HIGH voltage level at which oscilla-

tion occurs is defined as V

IHD

Verify that the GND reference recorded on the oscillo-

scope has not drifted to ensure the accuracy and repeat-

ability of the measurements.

TL/F/10688–6

FIGURE 1. Quiet Output Noise Voltage Waveforms

Note A: V

and V

are measured with respect to ground reference.

OLP

OHV

Note B: Input pulses have the following characteristics:

150 ps.

1 MHz,

3 ns, skew

3 ns, t

TL/F/10688–7

FIGURE 2. Simultaneous Switching Test Circuit

1...3 4 567 8 9 10

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