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54ACTQ32DM PDF预览

54ACTQ32DM

更新时间: 2024-02-22 05:00:55
品牌 Logo 应用领域
德州仪器 - TI 栅极逻辑集成电路
页数 文件大小 规格书
11页 542K
描述
ACT SERIES, QUAD 2-INPUT OR GATE, CDIP14, CERAMIC, DIP-14

54ACTQ32DM 技术参数

生命周期:Obsolete包装说明:DFP-14
Reach Compliance Code:unknownHTS代码:8542.39.00.01
风险等级:5.71Is Samacsys:N
其他特性:LG-MAX系列:ACT
JESD-30 代码:R-GDFP-F14长度:9.9 mm
逻辑集成电路类型:OR GATE功能数量:4
输入次数:2端子数量:14
最高工作温度:125 °C最低工作温度:-55 °C
封装主体材料:CERAMIC, GLASS-SEALED封装代码:DFP
封装形状:RECTANGULAR封装形式:FLATPACK
传播延迟(tpd):7.5 ns座面最大高度:2.02 mm
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):4.5 V
标称供电电压 (Vsup):5 V表面贴装:YES
技术:CMOS温度等级:MILITARY
端子形式:FLAT端子节距:1.27 mm
端子位置:DUAL宽度:6.35 mm
Base Number Matches:1

54ACTQ32DM 数据手册

 浏览型号54ACTQ32DM的Datasheet PDF文件第1页浏览型号54ACTQ32DM的Datasheet PDF文件第2页浏览型号54ACTQ32DM的Datasheet PDF文件第3页浏览型号54ACTQ32DM的Datasheet PDF文件第5页浏览型号54ACTQ32DM的Datasheet PDF文件第6页浏览型号54ACTQ32DM的Datasheet PDF文件第7页 
Absolute Maximum Ratings (Note 1)  
Supply Voltage (VCC  
)
−0.5V to +7.0V  
DC Input Diode Current (IIK  
VI = −0.5V  
)
−20 mA  
+20 mA  
VI = VCC + 0.5V  
DC Input Voltage (VI)  
−0.5V to VCC + 0.5V  
DC Output Diode Current (IOK  
VO = −0.5V  
)
−20 mA  
+20 mA  
VO = VCC + 0.5V  
DC Output Voltage (VO)  
−0.5V to VCC + 0.5V  
50 mA  
DC Output Source or Sink Current (IO)  
DC VCC or Ground Current per Output Pin (ICC or IGnd  
)
50 mA  
Thermal Resistance, Junction to Case (θJC  
)
See Mil-Std-1835  
−65˚C TA +150˚C  
175˚C  
Storage Temperature (TStg  
Junction Temperature (TJ)  
)
Maximum Power Dissipation (PD)  
500mW  
Lead Temperature (soldering, 10 seconds)  
300˚C  
Recommended Operating Conditions  
Supply Voltage (VCC  
)
4.5V to 5.5V  
0V to VCC  
Input Voltage (VI)  
Output Voltage (VO)  
0V to VCC  
Operating Temperature (TA)  
Minimum Input Edge Rate (V/t)  
VI from 0.8V to 2.0V  
−55˚C TA +125˚C  
125 mV/ns  
@
VCC 4.5V, 5.5V  
Maximum High Level Output Current (IOH  
)
−24mA  
+24mA  
Maximum Low Level Output Current (IOL  
)
Radiation Features  
54ACTQ32JRQMLV  
54ACTQ32WRQMLV  
100 krads (Si)  
100 krads (Si)  
Quality Conformance Inspection  
Mil-Std-883, Method 5005 - Group A  
Subgroup  
Description  
Static tests at  
Temp ˚C  
25  
1
2
Static tests at  
125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
25  
5
125  
-55  
6
7
25  
8A  
8B  
9
125  
-55  
25  
10  
11  
125  
-55  
3
www.national.com  

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