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54ACQ373 PDF预览

54ACQ373

更新时间: 2024-01-11 15:04:02
品牌 Logo 应用领域
美国国家半导体 - NSC 锁存器
页数 文件大小 规格书
8页 173K
描述
Quiet Series Octal Transparent Latch with TRI-STATE Outputs

54ACQ373 技术参数

生命周期:Obsolete包装说明:QCCN,
Reach Compliance Code:unknown风险等级:5.84
系列:ACJESD-30 代码:S-CQCC-N20
长度:8.89 mm负载电容(CL):50 pF
逻辑集成电路类型:BUS DRIVER位数:8
功能数量:1端口数量:2
端子数量:20最高工作温度:125 °C
最低工作温度:-55 °C输出特性:3-STATE
输出极性:TRUE封装主体材料:CERAMIC, METAL-SEALED COFIRED
封装代码:QCCN封装形状:SQUARE
封装形式:CHIP CARRIER传播延迟(tpd):16 ns
认证状态:Not Qualified筛选级别:MIL-STD-883
座面最大高度:1.905 mm最大供电电压 (Vsup):6 V
最小供电电压 (Vsup):2 V标称供电电压 (Vsup):3 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子形式:NO LEAD
端子节距:1.27 mm端子位置:QUAD
宽度:8.89 mm

54ACQ373 数据手册

 浏览型号54ACQ373的Datasheet PDF文件第1页浏览型号54ACQ373的Datasheet PDF文件第2页浏览型号54ACQ373的Datasheet PDF文件第3页浏览型号54ACQ373的Datasheet PDF文件第5页浏览型号54ACQ373的Datasheet PDF文件第6页浏览型号54ACQ373的Datasheet PDF文件第7页 
DC Characteristics for ’ACQ Family Devices (Continued)  
54ACQ  
=
Symbol  
Parameter  
VCC  
(V)  
TA  
Units  
Conditions  
−55˚C to +125˚C  
Guaranteed Limits  
50  
=
VOLD 1.65V Max  
IOLD  
Minimum Dynamic  
(Note 3)  
5.5  
mA  
=
VOHD 3.85V Min  
IOHD  
ICC  
Output Current  
5.5  
5.5  
−50  
mA  
µA  
=
Maximum Quiescent  
Supply Current  
80.0  
VIN VCC  
or GND (Note 4)  
=
IOZ  
Maximum TRI-STATE  
Leakage Current  
VI(OE) VIL, VIH  
=
±
5.5  
5.0  
5.0  
5.0  
µA  
V
VI VCC, GND  
=
VO VCC, GND  
VOLP  
Quiet Output  
1.5  
Maximum Dynamic VOL  
Quiet Output  
(Notes 5, 6)  
(Notes 5, 6)  
VOLV  
−1.2  
V
Maximum Dynamic VOL  
Note 2: All outputs loaded; thresholds on input associated with output under test.  
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.  
@
@
Note 4:  
I
and I  
CC  
3.0V are guaranteed to be less than or equal to the respective limit 5.5V V .  
IN  
CC  
@
@
I
for 54ACQ 25˚C is identical to 74ACQ 25˚C.  
CC  
Note 5: Plastic DIP package.  
Note 6: Max number of outputs defined as (n). Data inputs are driven 0V to 5V. One output GND.  
Note 7: Max number of data inputs (n) switching. (n−1) inputs switching 0V to 5V (’ACQ). Input-under-test switching: 5V to threshold (V ), 0V to threshold (V ),  
@
ILD IHD  
=
f
1 MHz.  
DC Characteristics for ’ACTQ Family Devices  
54ACTQ  
=
Symbol  
Parameter  
VCC  
(V)  
TA  
Units  
Conditions  
−55˚C to +125˚C  
Guaranteed Limits  
=
VIH  
VIL  
Minimum High Level  
Input Voltage  
4.5  
5.5  
4.5  
5.5  
4.5  
5.5  
2.0  
2.0  
0.8  
0.8  
4.4  
5.4  
V
V
V
VOUT 0.1V  
or VCC − 0.1V  
=
Maximum Low Level  
Input Voltage  
VOUT 0.1V  
or VCC − 0.1V  
=
VOH  
Minimum High Level  
Output Voltage  
IOUT −50 µA  
(Note 8)  
=
VIN VIL or VIH  
=
IOH −24 mA  
4.5  
5.5  
4.5  
5.5  
3.70  
4.70  
0.1  
V
V
=
IOH −24 mA  
=
VOL  
Maximum Low Level  
Output Voltage  
IOUT 50 µA  
0.1  
(Note 8)  
=
VIN VIL or VIH  
=
IOL 24 mA  
4.5  
5.5  
5.5  
0.50  
0.50  
V
=
IOL 24 mA  
=
±
IIN  
Maximum Input  
1.0  
µA  
µA  
VI VCC, GND  
Leakage Current  
Maximum TRI-STATE  
Leakage Current  
=
±
IOZ  
5.5  
5.0  
VI VIL, VIH  
=
VO VCC, GND  
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