Datasheet > 4299-11

4299-11

更新时间： 2022-02-26 11:08:36

品牌	Logo	应用领域
泰克 - TEKTRONIX		/
页数	文件大小	规格书
13页	1012K
描述
Series 2280S Precision Measurement, Low Noise, Programmable DC Power Supplies

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4299-11 数据手册

Series 2280S Precision Measurement, Low Noise, Programmable DC Power Supplies

Perform Semi-Automated Testing

Right on Your Bench

Test your design over its operating voltage range

automatically or study how it responds to DC output

changes by using the Series 2280S supplies’ built-in

List Mode function. Create and save up to 10 lists of

sequenced voltage levels with up to 99 distinct voltages

in each list. The duration of each voltage level can be set

as short as 1ms or as long as 60s. Create simple linear

ramps or any custom conﬁguration from either the front

Figure 4. Access the full functionality of the Series 2280S supplies from the

main menu.

panel or an interface bus. A single trigger will automatically

execute the list once or multiple times.

Figure 5. Conﬁgure the readback measurements exactly the way you need

them using a Measure Sub-screen.

Figure 7A. Create an output sequence using the List setup screen.

Controlled Rise and Fall Times

Protect Devices Under Test

Are you working on a device or a system with a high in-

rush current? Series 2280S supplies allow programming

the voltage output’s rise time to slow the voltage ramp and

avoid voltage overshoot, which could potentially damage

the DUT. The voltage fall time can also be controlled to

prevent a fast ramp down of the output voltage. Voltage

rise and fall times can be set as slow as 10 V/s or as fast

as 100V/s. Small voltage transitions can be programmed

to rise and fall as fast as 1000 V/s.

Figure 7B. Use the list mode to step the output voltage automatically

through a series of levels. The voltages were created by the list shown

in Fig. 7A.

power supply with no

slew rate control

2280S with

slew rate control

Figure 6. Programmable slew rates permit controlling voltage rise and fall

rates, preventing undesirable transients during power up

of capacitive loads.

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