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27C010TRT2FS-20 PDF预览

27C010TRT2FS-20

更新时间: 2024-01-30 12:51:21
品牌 Logo 应用领域
麦斯威 - MAXWELL 内存集成电路可编程只读存储器OTP只读存储器电动程控只读存储器
页数 文件大小 规格书
14页 200K
描述
1 Megabit (128K x 8-Bit) - OTP EPROM

27C010TRT2FS-20 数据手册

 浏览型号27C010TRT2FS-20的Datasheet PDF文件第1页浏览型号27C010TRT2FS-20的Datasheet PDF文件第2页浏览型号27C010TRT2FS-20的Datasheet PDF文件第3页浏览型号27C010TRT2FS-20的Datasheet PDF文件第5页浏览型号27C010TRT2FS-20的Datasheet PDF文件第6页浏览型号27C010TRT2FS-20的Datasheet PDF文件第7页 
27C010T  
1 Megabit (128K x 8-Bit) - OTP EPROM  
1
TABLE 7. 27C010T AC ELECTRICAL CHARACTERISTICS FOR READ OPERATION  
(VCC = 5V ± 10%, VPP = VSS, TA = -55 TO +125 °C, UNLESS OTHERWISE SPECIFIED)  
PARAMETER  
TEST CONDITION  
SYMBOL  
SUB GROUPS  
MIN  
MAX  
UNIT  
Address Access Time  
CE = OE = VIL  
tACC  
9, 10, 11  
ns  
- 120  
- 150  
- 200  
--  
--  
--  
120  
150  
200  
Chip Enable Access Time  
OE = VIL  
tCE  
tOE  
tOH  
tDF  
9, 10, 11  
9, 10, 11  
9, 10, 11  
9, 10, 11  
ns  
ns  
ns  
ns  
- 120  
- 150  
- 200  
--  
--  
--  
120  
150  
200  
Output Enable Access TIme  
CE = VIL  
- 120  
- 150  
- 200  
--  
--  
--  
60  
70  
70  
Output Hold to Address Change  
CE = VIL  
- 120  
- 150  
- 200  
0
0
0
--  
--  
--  
Output Disable to High-Z 2  
CE = OE = VIL  
- 120  
- 150  
- 200  
0
0
0
50  
50  
50  
1. Test conditions:  
- Input pulse levels 0.45V/2.4V  
- Input rise and fall times < 10 ns  
- Output load 1 TTL gate + 100 pF (including scope and jig)  
- Referenced levels for measuring timing 0.8V/2.0V  
2. tDF is defined as the time at which the output becomes an open circuit and data is no longer driven.  
12.12.01 Rev 2  
All data sheets are subject to change without notice  
4
©2001 Maxwell Technologies  
All rights reserved.  

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