246 RTI-V
Vishay BCcomponents
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Table 6
MULTIPLIER OF RIPPLE CURRENT (IR) AS A FUNCTION OF FREQUENCY
FREQUENCY (Hz)
UR
50
100
300
1000
R MULTIPLIER
0.90
3000
10 000
100 000
(V)
I
16
25
35
50
63
0.60
0.60
0.50
0.35
0.35
0.70
0.70
0.65
0.50
0.50
0.85
0.85
0.80
0.65
0.65
0.95
0.95
0.90
0.90
0.90
1.00
1.00
0.95
0.90
0.90
1.00
1.00
1.00
1.00
1.00
0.90
0.85
0.80
0.80
Table 7
TEST PROCEDURES AND REQUIREMENTS
TEST
PROCEDURE
REQUIREMENTS
ΔC/C: 15 ꢀ
tan δ ≤ 1.3 x spec. limit
Z ≤ 2 x spec. limit
IL2 ≤ spec. limit
(quick reference)
NAME OF TEST
REFERENCE
IEC 60384-4 /
EN130300
subclause 4.13
T
amb = 125 °C; UR applied;
for test duration see Table 3
Endurance
ΔC/C: 30 ꢀ
tan δ ≤ 3 x spec. limit
Z ≤ 3 x spec. limit
IL2 ≤ spec. limit
no short or open circuit
total failure percentage: ≤ 1 ꢀ
CECC 30301
subclause 1.8.1
T
amb = 125 °C; UR and IR applied;
Useful life
Shelf life
for test duration see Table 3
ΔC/C: 15 ꢀ
Tamb = 125 °C; no voltage applied;
IEC 60384-4 /
EN130300
subclause 4.17
1000 h
tan δ ≤ 1.3 x spec. limit
Z ≤ 3 x spec. limit
IL2 ≤ spec. limit
after test: UR to be applied for 30 min,
24 h o 48 h before measurement
Statements about product lifetime are based on calculations and internal testing. They should only be interpreted as estimations. Also due to external factors, the
lifetime in the field application may deviate from the calculated lifetime. In general, nothing stated herein shall be construed as a guarantee of durability.
Revision: 27-Apr-2022
Document Number: 28422
7
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