Datasheet > 2115D150M0000IAK

2115D150M0000IAK

更新时间： 2023-03-15 00:00:00

品牌	Logo	应用领域
美高森美 - MICROSEMI		/
页数	文件大小	规格书
26页	1219K
描述
Sine Output Oscillator,

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2115D150M0000IAK 数据手册

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5.1.1 Screening Options. The Screening Options, by letter, are summarized as:

(K) Modified MIL-PRF-38534 Class K Screening, Group A QCI and 30-day aging

(S) MIL-PRF-55310 Class S Screening, Groups A & B QCI

(B) MIL-PRF-55310 Class B Screening, Groups A & B QCI

(X) Engineering Model (EM)

5.2 Optional Design, Test and Data Parameters. The following is a list of design, assembly,

inspection and test options that can be added by purchase order request.

a. Design Pedigree (choose one as the 5^thcharacter in the part number):

(E) Class S components, Enhanced Element Evaluation, Swept Quartz

(R) Class S components, Swept Quartz

(B) Class B components, Swept Quartz

(D) COTS components, Non-Swept Quartz

b. Input Voltage as the 15^thcharacter

c. Frequency-Temperature Slew Test

d. Radiographic Inspection

e. Group C Inspection: MIL-PRF-55310 (requires 8 destruct specimens)

f. Group C Inspection: MIL-PRF-38534, Table C-Xc, Periodic Inspection (requires 10

destruct specimens – 5 pc. [SG 1(5/0), SG 3(3/0)], 5 pc. SG 2 (5/0). Subgroup 1 fine

leak test to be performed per MIL-STD-202, Method 112, Condition C.

g. Internal Water-Vapor Content (RGA) samples and test performance

h. MTBF Reliability Calculations

i. Worst Case/Derating Analysis

j. Deliverable Process Identification Documentation (PID)

k. Customer Source Inspection (pre-cap / final) [Note: Model numbers 2105, 2205, 2115

and 2215 require two pre-cap inspections.]

l. Destruct Physical Analysis (DPA): MIL-STD-1580 with exceptions as specified in

Vectron DOC203982.

m. Qualification: In accordance with MIL-PRF-55310, Table IV (requires 11 destruct

specimens).

n. Qualification: In accordance with EEE-INST-002, Section C4, Table 3, Level 1 or 2

(requires 11 destruct specimens)

o. High Resolution Digital Pre-Cap Photographs (20 Megapixels minimum)

p. Hot solder dip of leads with Sn63/Pb37 solder prior to shipping.

5.2.1 NASA EEE-INST-002. A combination of design pedigrees E or R along with Screening

option S and Group C Inspection in accordance with MIL-PRF-55310, meet the requirements

of Level 1 device reliability. A combination of design pedigrees B or C along with screening

option C and Group C Inspection in accordance with MIL-PRF-55310, meet the requirements

of Level 2 device reliability.

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

DOC200103

1...4 5 678 9 10...26

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