1SS293
TOSHIBA Diode Silicon Epitaxial Schottky Barrier Type
1SS293
Unit: mm
Low Voltage High Speed Switching
z Low forward voltage
z Low reverse surrent
z Small package
: V
= 0.54V (typ.)
F (3)
: I = 5μA (max)
R
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Maximum (peak) reverse voltage
Reverse voltage
V
45
40
V
V
RM
V
R
Maximum (peak) forward current
Average forward current
Power dissipation
I
300
mA
mA
mW
°C
FM
I
100
O
P
300
Junction temperature
T
j
125
Storage temperature range
T
stg
−55~125
°C
JEDEC
―
EIAJ
SC−61
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
TOSHIBA
Weight: 0.13g
1−4E2D
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are
within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Electrical Characteristics (Ta = 25°C)
Test
Circuit
Characteristic
Symbol
Test Condition
= 1mA
Min
Typ.
Max
Unit
V
V
V
V
―
I
I
I
―
―
―
―
―
0.28
0.36
0.54
―
―
―
F (1)
F (2)
F (3)
F
F
F
Forward voltage
―
= 10mA
―
= 100mA
0.60
5
Reverse current
I
―
V
V
= 40V
μA
R
R
R
Total capacitance
C
―
= 0, f = 1MHz
18
25
pF
T
1
2007-11-01