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1SS293_07 PDF预览

1SS293_07

更新时间: 2022-04-23 23:00:11
品牌 Logo 应用领域
东芝 - TOSHIBA 开关
页数 文件大小 规格书
3页 176K
描述
Low Voltage High Speed Switching

1SS293_07 数据手册

 浏览型号1SS293_07的Datasheet PDF文件第2页浏览型号1SS293_07的Datasheet PDF文件第3页 
1SS293  
TOSHIBA Diode Silicon Epitaxial Schottky Barrier Type  
1SS293  
Unit: mm  
Low Voltage High Speed Switching  
z Low forward voltage  
z Low reverse surrent  
z Small package  
: V  
= 0.54V (typ.)  
F (3)  
: I = 5μA (max)  
R
Absolute Maximum Ratings (Ta = 25°C)  
Characteristic  
Symbol  
Rating  
Unit  
Maximum (peak) reverse voltage  
Reverse voltage  
V
45  
40  
V
V
RM  
V
R
Maximum (peak) forward current  
Average forward current  
Power dissipation  
I
300  
mA  
mA  
mW  
°C  
FM  
I
100  
O
P
300  
Junction temperature  
T
j
125  
Storage temperature range  
T
stg  
55~125  
°C  
JEDEC  
EIAJ  
SC61  
Note: Using continuously under heavy loads (e.g. the application of high  
temperature/current/voltage and the significant change in  
TOSHIBA  
Weight: 0.13g  
14E2D  
temperature, etc.) may cause this product to decrease in the  
reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are  
within the absolute maximum ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Electrical Characteristics (Ta = 25°C)  
Test  
Circuit  
Characteristic  
Symbol  
Test Condition  
= 1mA  
Min  
Typ.  
Max  
Unit  
V
V
V
V
I
I
I
0.28  
0.36  
0.54  
F (1)  
F (2)  
F (3)  
F
F
F
Forward voltage  
= 10mA  
= 100mA  
0.60  
5
Reverse current  
I
V
V
= 40V  
μA  
R
R
R
Total capacitance  
C
= 0, f = 1MHz  
18  
25  
pF  
T
1
2007-11-01  

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