1SS200
TOSHIBA Diode Silicon Epitaxial Planar Type
1SS200
Unit: mm
Ultra High Speed Switching Application
z Low forward voltage
: V
= 0.92V (typ.)
F (3)
z Fast reverse recovery time: t = 1.6ns (typ.)
rr
z Small total capacitance
: C = 2.2pF (typ.)
T
Absolute Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Maximum (peak) reverse voltage
Reverse voltage
V
85
80
V
V
RM
V
R
Maximum (peak) forward current
Average forward current
Surge current (10ms)
I
300 (*)
100 (*)
2 (*)
mA
mA
A
FM
I
O
I
FSM
P
Power dissipation
200
mW
°C
°C
Junction temperature
T
j
125
JEDEC
―
―
Storage temperature range
T
−55~125
stg
EIAJ
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
TOSHIBA
Weight: 0.13g
1-4E2B
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are
within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
(*) Unit Rating. Total Rating = Unit Rating × 1.5.
Electrical Characteristics (Ta = 25°C)
Test
Circuit
Characteristic
Symbol
Test Condition
= 1mA
Min
Typ.
Max
Unit
V
V
V
V
―
I
I
I
―
―
―
―
―
―
―
0.61
0.74
0.92
―
―
―
F (1)
F (2)
F (3)
R (1)
R (2)
F
F
F
Forward voltage
―
= 10mA
―
= 100mA
1.20
0.1
0.5
4.0
4.0
I
I
―
V
V
V
= 30V
R
R
R
Reverse current
μA
―
= 80V
―
Total capacitance
C
T
―
= 0, f = 1MHz
2.2
1.6
pF
ns
Reverse recovery time
t
―
I = 10mA (Fig.1)
F
rr
1
2007-11-01