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100302

更新时间: 2024-01-03 07:43:32
品牌 Logo 应用领域
美国国家半导体 - NSC
页数 文件大小 规格书
6页 110K
描述
Low Power Quint 2-Input OR/NOR Gate

100302 技术参数

是否Rohs认证: 不符合生命周期:Transferred
包装说明:QFF, QFL24,.4SQReach Compliance Code:unknown
风险等级:5.85Is Samacsys:N
JESD-30 代码:S-XQFP-F24JESD-609代码:e0
逻辑集成电路类型:OR/NOR GATE端子数量:24
最高工作温度:125 °C最低工作温度:-55 °C
封装主体材料:CERAMIC封装代码:QFF
封装等效代码:QFL24,.4SQ封装形状:SQUARE
封装形式:FLATPACK电源:-4.5 V
最大电源电流(ICC):48 mAProp。Delay @ Nom-Sup:1.7 ns
认证状态:Not Qualified施密特触发器:NO
筛选级别:38535V;38534K;883S子类别:Gates
表面贴装:YES技术:ECL100K
温度等级:MILITARY端子面层:Tin/Lead (Sn/Pb)
端子形式:FLAT端子节距:1.27 mm
端子位置:QUADBase Number Matches:1

100302 数据手册

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Absolute Maximum Ratings (Note 1)  
ESD (Note 2)  
2000V  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales Office/  
Distributors for availability and specifications.  
Recommended Operating  
Conditions  
Case Temperature (TC)  
Military  
Above which the useful life may be impaired  
Storage Temperature (TSTG  
)
−65˚C to +150˚C  
−55˚C to +125˚C  
−5.7V to −4.2V  
Maximum Junction Temperature (TJ)  
Ceramic  
Supply Voltage (VEE  
)
+175˚C  
Note 1: Absolute maximum ratings are those values beyond which the de-  
vice may be damaged or have its useful life impaired. Functional operation  
under these conditions is not implied.  
VEE Pin Potential to  
Ground Pin  
−7.0V to +0.5V  
VEE to +0.5V  
−50 mA  
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.  
Input Voltage (DC)  
Output Current (DC Output HIGH)  
Military Version  
DC Electrical Characteristics  
=
=
=
=
VEE −4.2V to −5.7V, VCC VCCA GND, TC −55˚C to +125˚C (Note 5)  
Symbol  
Parameter  
Min  
Max Units  
TC  
0˚C to +125˚C  
−55˚C  
Conditions  
Notes  
VOH  
Output HIGH Voltage  
−1025 −870  
−1085 −870  
−1830 −1620  
−1830 −1555  
−1035  
mV  
mV  
mV  
mV  
mV  
mV  
mV  
mV  
mV  
=
VIN VIH(Max)  
Loading with  
(Notes 3, 4,  
5)  
VOL  
VOHC  
VOLC  
VIH  
VIL  
Output LOW Voltage  
Output HIGH Voltage  
Output LOW Voltage  
Input HIGH Voltage  
Input LOW Voltage  
Input LOW Current  
Input HIGH Current  
Power Supply Current  
0˚C to +125˚C  
−55˚C  
or VIL (Min)  
50to −2.0V  
0˚C to +125˚C  
−55˚C  
=
−1085  
VIN VIH(Max)  
Loading with  
(Notes 3, 4,  
5)  
−1610  
0˚C to +125˚C  
−55˚C  
or VIL (Min)  
50to −2.0V  
−1555  
−1165 −870  
−55˚C to +125˚C  
Guaranteed HIGH Signal  
for All Inputs  
(Notes 3, 4,  
5, 6)  
−1830 −1475  
0.50  
mV  
µA  
−55˚C to +125˚C  
−55˚C to +125˚C  
Guaranteed LOW Signal  
for All Inputs  
(Notes 3, 4,  
5, 6)  
=
VEE −4.2V  
IIL  
(Notes 3, 4,  
5)  
=
VIN VIH (Max)  
=
VEE −5.7V  
IIH  
240  
340  
µA  
µA  
0˚C to +125˚C  
−55˚C  
(Notes 3, 4,  
5)  
=
VIN VIL(Min)  
IEE  
−48  
−17  
mA  
−55˚C to +125˚C  
Inputs Open  
(Notes 3, 4,  
5, 6)  
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately  
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case  
condition at cold temperatures.  
Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.  
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.  
Note 6: Guaranteed by applying specified input condition and testing V /V  
.
OH OL  
AC Electrical Characteristics  
=
=
=
VEE −4.2V to −5.7V, VCC VCCA GND  
=
=
=
Symbol  
Parameter  
TC −55˚C  
TC +25˚C  
TC +125˚C Units  
Conditions  
Notes  
Min  
Max  
Min  
Max  
Min  
Max  
tPLH  
tPHL  
tPLH  
tPHL  
tTLH  
tTHL  
Propagation Delay  
Data to Output  
0.30  
1.80  
0.40  
1.50  
0.40  
1.70  
ns  
ns  
(Notes 7, 8,  
9, 10, 11)  
Propagation Delay  
Enable to Output  
Transition Time  
0.60  
0.30  
2.60  
1.20  
0.80  
0.30  
2.30  
1.20  
0.80  
0.30  
2.80  
1.20  
Figures 1, 2  
(Note 10)  
ns  
20% to 80%, 80% to 20%  
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately  
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.  
3
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