X7R Dielectric
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
X7R Specification Limits
Measuring Conditions
Temperature Cycle Chamber
-55ºC to +125ºC
Within specified tolerance
Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
For Cap > 10µF, 0.5Vrm @ 120Hz
≤ 10% for ≥ 50V DC rating≤ 12.5% for 25V DC rating
≤ 12.5% for 25V and 16V DC rating
≤ 12.5% for ≤ 10V DC rating
Dissipation Factor
Contact Factory for DF by PN
100,000MΩ or 1000MΩ - µF,
whichever is less
Charge device with rated voltage for
120 ± 5 secs @ room temp/humidity
Insulation Resistance
Charge device with 250% of rated voltage for 1-5 seconds, w/
charge and discharge current limited to 50 mA (max)
Note: Charge device with 150% of rated voltage for 500V devices.
Dielectric Strength
No breakdown or visual defects
Appearance
Capacitance
Variation
No defects
≤ ±12%
Resistance to
Flexure
Stresses
Deflection: 2mm
Test Time: 30 seconds
Dissipation
Meets Initial Values (As Above)
≥ Initial Value x 0.3
Factor
Insulation
Resistance
≥ 95% of each terminal should be covered with
fresh solder
Dip device in eutectic solder at 230 ± 5ºC
for 5.0 ± 0.5 seconds
Solderability
Appearance
Capacitance
Variation
No defects, <25% leaching of either end terminal
≤ ±7.5%
Dissipation
Dip device in eutectic solder at 260ºC for 60 seconds. Store at
room temperature for 24 ± 2hours before measuring electrical
properties.
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Resistance to
Solder Heat
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
No visual defects
≤ ±7.5%
Step 1: -55ºC ± 2º
30 ± 3 minutes
≤ 3 minutes
Step 2: Room Temp
Dissipation
Factor
Insulation
Resistance
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Step 3: +125ºC ± 2º
30 ± 3 minutes
Thermal Shock
Step 4: Room Temp
≤ 3 minutes
Dielectric
Repeat for 5 cycles and measure after 24 ± 2 hours at room
temperature
Pre-treatment: After mounting, perform heat treatment 150+0/-
10C for 2 hour, then stabilise for 24+/-2 hour at room temp,
then measure.
Meets Initial Values (As Above)
No visual defects
Strength
Appearance
Capacitance
Variation
≤ ±12.5%
Dissipation
Factor
Insulation
Resistance
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Charge device with ≥ rated voltage in test chamber set at
125ºC ± 2ºC for 1000 hours (+48, -0).
Load Life
Pre-treatment: After remove from test chamber, perform heat
treatment 150+0/-10C for 2 hour, then stabilise for 24+/-2 hour
at room temp, then measure.
Dielectric
Strength
Meets Initial Values (As Above)
Contact AVX for datasheet of specific parts.
Appearance
Capacitance
Variation
No visual defects
≤ ±12.5%
Pre-treatment: After mounting, perform heat treatment 150+0/-
10C for 2 hour, then stabilise for 24+/-2 hour at room temp,
then measure.
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Load
Humidity
Store in a test chamber set at 85ºC ± 2ºC/ 85% ± 5% relative
humidity for 1000 hours (+48, -0) with rated voltage applied.
Pre-treatment: After remove from test chamber, perform heat
treatment 150+0/-10C for 2 hour, then stabilise for 24+/-2 hour
at room temp, then measure.
Meets Initial Values (As Above)
The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or
available online at www.avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.
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