Datasheet > Z0110MUF2AL2

Z0110MUF2AL2

更新时间： 2022-09-10 15:44:00

品牌	Logo	应用领域
意法半导体 - STMICROELECTRONICS		可控硅
页数	文件大小	规格书
12页	127K
描述
Standard 1A Triacs

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Z0110MUF2AL2 数据手册

Z01

Characteristics

Figure 9.

On-state characteristics

(maximum values) (I = f(V

Figure 10. Relative variation of critical rate

of decrease of main current versus

(dV/dt)

)

I (A)

(dI/dt)c [(dV/dt)c] / Specified (dI/dt)c

10.0

2.6

2.4

2.2

2.0

1.8

1.6

1.4

1.2

1.0

0.8

0.6

0.4

0.2

0.0

= T max.

1.0

T_j=max.

V_t0=0.95 V

R_d=400 mΩ

Z0109

= 25°C

Z0103

Z0107

Z0110

(dV/dt)c (V/µs)

(V)

0.1

1.0

10.0

100.0

0.0

0.5

1.0

1.5

2.0

2.5

3.0

3.5

4.0

4.5

5.0

Figure 11. Relative variation of critical rate of Figure 12. SOT-223 and SMBflat-3L thermal

decrease of main current (dI/dt)

versus junction temperature

resistance junction to ambient

versus copper surface under case

R_th(j-a)(°C/W)

170

160

150

140

130

120

110

100

(dI/dt)c [T ] / (dI/dt)c [T Specified]

SMBF3L

SOT223

T (°C)

S_CU(cm²)

100

125

Figure 13. Relative variation of static dV/dt immunity versus junction temperature (gate open)

dV/dt [T_j] / dV/dt [T_j=125 °C]

V_D=V_R=402V

T_j(°C)

100

125

Doc ID 7474 Rev 10

5/12

1 2 3 456 7 8...12

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