S Series
FIGURE 5 - LONG-TERM STABILITY OVER 29 YEARS (0.1W AT 70°C, 50 SAMPLES S102C,
10K)
40
20
0
-20
-40
-60
-80
-100
-120
0
5
10
15
20
25
30
Time (Years)
STANDARD OPERATIONS AND TEST
CONDITIONS
A. Standard Test Operations:
IMPROVED PERFORMANCE TESTING (IPT)
The preceding information is based on product directly off
the production line. Improved performance (meaning
increased time stability with load and other stresses) is
available through factory conducted “Improved Performance
Testing”. The test routine is usually tailored to the user’s
stability objectives and IPT-processed resistors can exhibit
improved load-life stability levels of less than 50 ppm.
By 100 % Inspection
Short-time overload (6.25 x rated power for 5 s)
Resistance - tolerance check
Visual and mechanical
By Sample Inspection
TCR
Various screen test routines are available and all anticipated
stresses must be taken into account before settling on one
specific test routine. VFR's application engineering
department is prepared to discuss and recommend
appropriate routines given the full spectrum of anticipated
stresses and stability requirements.
Environmental tests per table 3 on a quarterly basis to
establish performance by similarity
B. Standard Test Conditions:
Lead test point: 0.5" (12.7 mm) from resistor body
Temperature: + 23 °C ± 2 °C
Relative humidity: per MIL-STD-202
TABLE 4 - “S” SERIES SPECIFICATIONS
Stability (1)
Load life at 2000 h
± 0.015 % (150 ppm) Maximum R at 0.3 W/+ 125 °C
± 0.005 % (50 ppm)
± 0.05 % (500 ppm)
± 0.01 % (100 ppm)
0.010 µV
Maximum R at 0.1 W/+ 70 °C
Maximum R at 0.3 W/+ 125 °C
Maximum R at 0.05 W/+ 125 °C
(RMS)/V of applied voltage (- 40 dB)
Load life at 10 000 h
Current Noise
High Frequency Operation
Rise time
1.0 ns at 1 k
Inductance (L) (2)
0.1 µH maximum; 0.08 µH typical
1.0 pF maximum; 0.5 pF typical
< 0.1 ppm/V (3)
Capacitance (C)
Voltage Coefficient
Thermal Electromotive Force (EMF) (4)
0.1 µV/°C Maximum; 0.05 µV/°C typical
1 µV/W
(Model S102C)
Notes
(1)
Load life R maximum can be reduced by 80 %, please contact applications engineering department.
(2)
(3)
(4)
Inductance (L) due mainly to the leads.
The resolution limit of existing test equipment (within the measurement capability of the equipment, or “essentially zero”.)
µV/°C relates to EMF due to lead temperature difference and µV/watt due to power applied to the resistor.
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Document Number: 63001
Revision: 02-Mar-15