5秒后页面跳转
WLFW2520Z0HR10PB PDF预览

WLFW2520Z0HR10PB

更新时间: 2024-01-05 06:05:42
品牌 Logo 应用领域
华新科技 - WALSIN LTE过滤器扼流圈测试电感器
页数 文件大小 规格书
6页 291K
描述
Wire Wound Ferrite Chip Inductors

WLFW2520Z0HR10PB 技术参数

生命周期:Active包装说明:1008
Reach Compliance Code:compliant风险等级:5.7
大小写代码:1008构造:Rectangular
型芯材料:FERRITE直流电阻:0.196 Ω
标称电感 (L):0.1 µH电感器应用:FILTER CHOKE
电感器类型:GENERAL PURPOSE INDUCTOR功能数量:1
端子数量:2最高工作温度:125 °C
最低工作温度:-40 °C封装高度:1.83 mm
封装长度:2.7 mm封装形式:SMT
封装宽度:2.59 mm包装方法:TR, Embossed Plastic, 7 Inch
最小质量因数(标称电感时):50最大额定电流:0.7 A
自谐振频率:1800 MHz形状/尺寸说明:RECTANGULAR PACKAGE
屏蔽:NO表面贴装:YES
端子位置:DUAL ENDED端子形状:ONE SURFACE
测试频率:50 MHz容差:3%
Base Number Matches:1

WLFW2520Z0HR10PB 数据手册

 浏览型号WLFW2520Z0HR10PB的Datasheet PDF文件第1页浏览型号WLFW2520Z0HR10PB的Datasheet PDF文件第2页浏览型号WLFW2520Z0HR10PB的Datasheet PDF文件第3页浏览型号WLFW2520Z0HR10PB的Datasheet PDF文件第5页浏览型号WLFW2520Z0HR10PB的Datasheet PDF文件第6页 
TEST INSTRUMENT  
LQ TEST BY HP4291B  
SRF TEST BY HP 8753E  
DCR TEST BY ZENTECH 502BC  
RELIABILITY PERFORMANCE  
Reliability Experiment For Electrical  
Test Item  
Test Condition  
Standard Source  
MIL-STD-202G  
Method 103B  
Test Condition B  
+40± 2, humidity of 90% ± 5% (total 96 hours).  
Humidity Test  
1.Temperature: +125±2℃  
2.Test time: 48±2hrs  
High Temperature  
Test  
IEC 68-2  
Test Condition B  
1.Temperature: -40±2℃  
2.Test time: 48±2hrs  
Low Temperature  
Test  
IEC 68-2  
Test Condition A  
MIL-STD-202G  
Method 107G  
Test Condition B-  
2
+125±5(30 minutes) ~ -40 ± 5(30 minutes),  
temperature switch time: 5 minutes (total 50 cycles).  
Thermal Shock  
Life Test  
MIL-STD-202G  
Method 108A  
Test Condition B  
+70±5℃ (250Hours)  
Reliability Experiment For Physical  
Test Item  
Test Condition  
Standard Source  
10-55-10HZ, amplitude: 1.5mm, direction: X, Y, Z axes, MIL-STD-202G  
Vibration Test  
each axis 2 hours (total 6 hours).  
Method 201A  
IR/convection reflow:Peak Temp 250±5for 5Sec in  
air, Through 2 Cycle. Temperature  
Ramp:+1~4°C/sec; Above1 83°C, must keep 90 s - 120  
s
MIL-STD-202G  
Method 210F  
Test Condition  
(Reflow)  
Solder Heat  
Resistance Test  
Soak in 245 solder pot of 3Sec, PAD must have  
95% above coverage.  
Solder Ability Test  
J-STD-003B  
Page 4 of 6  
ASC_WLFW2520 Series_V4.0  
Nov. Y2017  

与WLFW2520Z0HR10PB相关器件

型号 品牌 获取价格 描述 数据表
WLFW2520Z0J100PB WALSIN

获取价格

Wire Wound Ferrite Chip Inductors
WLFW2520Z0J120PB WALSIN

获取价格

Wire Wound Ferrite Inductor: WLFW/WFI Series 12, 30, 270mA
WLFW2520Z0J150PB WALSIN

获取价格

Wire Wound Ferrite Inductor: WLFW/WFI Series 15, 38, 250mA
WLFW2520Z0J1R0PB WALSIN

获取价格

Wire Wound Ferrite Chip Inductors
WLFW2520Z0J1R2PB WALSIN

获取价格

Wire Wound Ferrite Inductor: WLFW/WFI Series 1.2, 48, 650mA
WLFW2520Z0J1R5PB WALSIN

获取价格

Wire Wound Ferrite Inductor: WLFW/WFI Series 1.5, 41, 630mA
WLFW2520Z0J1R8PB WALSIN

获取价格

Wire Wound Ferrite Inductor: WLFW/WFI Series 1.8, 39, 600mA
WLFW2520Z0J220PB WALSIN

获取价格

Wire Wound Ferrite Inductor: WLFW/WFI Series 22, 10, 120mA
WLFW2520Z0J2R2PB WALSIN

获取价格

Wire Wound Ferrite Inductor: WLFW/WFI Series 2.2, 34, 520mA
WLFW2520Z0J2R7PB WALSIN

获取价格

Wire Wound Ferrite Inductor: WLFW/WFI Series 2.7, 34, 490mA