CCD area image sensor S7010/S7011/S7015 series
ꢀ A bsolute m axim um ratings (T a=25 °C )
P aram eter
O perating tem perature
S ym bol
Topr
M in.
-50
-50
-0.5
-0.5
-0.5
-0.5
-10
-10
-10
-10
-10
-10
-10
-10
Typ.
M ax.
+30
+70
+25
+18
+18
+18
+15
+15
+15
+15
+15
+15
+15
+15
U nit
°C
°C
V
-
-
-
-
-
-
-
-
-
-
-
-
-
-
S torage tem perature
O D voltage
Tstg
V O D
R D voltage
V R D
V
IS V voltage
V IS V
V
IS H voltage
V IS H
V
IG V voltage
V IG 1V , V IG 2V
V IG 1H , V IG 2H
V S G
V
IG H voltage
V
S G voltage
V
O G voltage
V O G
V
R G voltage
V R G
V
TG voltage
V T G
V
V ertical clock voltage
H orizontal clock voltage
V P 1V , V P 2V
V P 1H , V P 2H
V
V
O perating conditions (M P P m ode, T a=25 °C )
P aram eter
ꢀ
S ym bol
V O D
M in.
18
11.5
1
Typ.
20
12
3
M ax.
U nit
V
O utput transistor drain voltage
R eset drain voltage
22
V R D
12.5
V
O utput gate voltage
V O G
5
-
V
S ubstrate voltage
V S S
-
0
V
Test point (vertical input source)
Test point (horizontal input source)
Test point (vertical input gate)
Test point (horizontal input gate)
V IS V
-
V R D
V R D
0
-
V
V IS H
-
-
V
V IG 1V , V IG 2V
V IG 1H , V IG 2H
V P 1V H , V P 2V H
V P 1V L, V P 2V L
V P 1H H , V P 2H H
V P 1H L, V P 2H L
V S G H
-8
-8
4
-
V
0
-
V
V ertical shift register
clock voltage
H igh
Low
H igh
Low
H igh
Low
H igh
Low
H igh
Low
6
8
V
V
V
V
V
-9
4
-8
6
-7
8
H orizontal shift register
clock voltage
-9
4
-8
6
-7
8
S um m ing gate voltage
R eset gate voltage
V S G L
-9
4
-8
6
-7
8
V R G H
V R G L
-9
4
-8
6
-7
8
V T G H
Transfer gate voltage
V T G L
-9
-8
-7
ꢀ E lectrical characteristics (Ta=25 °C )
P aram eter
S ym bol
fc
C P 1V , C P 2V
C P 1H , C P 2H
C S G
M in.
Typ.
-
3,000
120
7
M ax.
U nit
M H z
pF
S ignal output frequency
-
-
-
-
-
-
1
-
Vertical shift register capacitance *3
H orizontal shift register capacitance *3
S um m ing gate capacitance
R eset gate capacitance
-
pF
-
pF
C R G
7
-
pF
Transfer gate capacitance
C harge transfer efficiency *4
D C output level *5
C T G
120
-
pF
C TE
V out
Z o
0.99995
0.99999
-
18
-
-
V
12
15
3
O utput im pedance *5
-
-
kW
m W
6
P ow er consum ption *5
*3: S 7010/S 7011-1007
*
P
15
-
*4: C harge transfer efficiency per pixel, m easured at half of the full w ell.
*5: The values depend on the loa d resistance. (typical, V O D =20 V, load resistance=22 kW )
*6: P ow er consum ption of the on -chip am plifier.
ꢀ E lectrical and optical characteristics (Ta=25 °C , unless otherw ise noted)
P aram eter
S ym bol
V sat
M in.
Typ.
F w × S v
300,000
600,000
2.2
M ax.
-
-
U nit
V
S aturation output voltage
-
150,000
V ertical
Horizontal *7
F ull w ell capacity
F w
S v
D S
N r
e-
300,000
-
-
C C D node sensitivity
D ark current *8 M PP m ode
1.8
-
-
µV /e-
25 °C
0 °C
400
3000
150
e-/pixel/s
20
(tentative data)
R eadout noise *9
-
8
12
e- rm s
Line binnng
A rea scanning
P hoto response non-uniform ity *1 1
25,000
12,000
-
75,000
37,500
±3
-
-
-
-
D ynam ic range *1 0
D R
P R N U
±10
%
S pectral response range
-
400 to 1,100
-
nm
l
*7: Large horizontal full w ell for vertical binning operation.
*8: D ark current nearly doubles for every 5 to 7 °C increase in tem perature.
*9: -40 °C , operating frequency is 150 kH z.
*10: D ynam ic range: D R = F ull w ell/R eadout noise.
*11: M easured at half of full w ell capa city.
P hoto response non-uniform ity:
Fixed pattern noise (peak to peak)
P R N U (% ) =
× 100
Signal
2