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RH18G3R3B251 PDF预览

RH18G3R3B251

更新时间: 2024-04-09 18:56:34
品牌 Logo 应用领域
华新科技 - WALSIN /
页数 文件大小 规格书
13页 4191K
描述
0603, X8G, 3.3pF, 250Vdc

RH18G3R3B251 数据手册

 浏览型号RH18G3R3B251的Datasheet PDF文件第6页浏览型号RH18G3R3B251的Datasheet PDF文件第7页浏览型号RH18G3R3B251的Datasheet PDF文件第8页浏览型号RH18G3R3B251的Datasheet PDF文件第10页浏览型号RH18G3R3B251的Datasheet PDF文件第11页浏览型号RH18G3R3B251的Datasheet PDF文件第12页 
Multilayer Ceramic Capacitors  
Approval Sheet  
10. RELIABILITY TEST CONDITIONS AND REQUIREMENTS  
No.  
Item  
Test Conditions  
Requirements  
1. Visual and  
Mechanical  
---  
* No remarkable defect.  
* Dimensions to conform to individual specification sheet.  
2. Capacitance  
3. Q/ D.F.  
(Dissipation  
Factor)  
* Test temp.: Room Temperature.  
1.0±0.2Vrms, 1MHz±10%  
* Shall not exceed the limits given in the detailed spec.  
* Q800+20C  
* To apply voltage:  
4. Dielectric  
Strength  
* No evidence of damage or flash over during test.  
200V ~ 250V : 200% of rated voltage.  
* Duration: 1 to 5 sec.  
* Charge & discharge current less than 50mA.  
5. Insulation  
Resistance  
* Test temp.: Room Temperature.  
10Gor RxC100-F whichever is smaller  
* Capacitance change: within ±30ppm/°C;  
100V : To apply rated voltage for max. 120 sec.  
200V :To apply rated voltage (500V max.) for 60 sec.  
With no electrical load.  
6. Temperature  
Coefficient  
Operating temperature: -55~150°C at 25°C  
7. Adhesive  
Strength of  
Termination  
* Pressurizing force  
0402 to 0603: 5N  
>0603: 10N  
* No remarkable damage or removal of the terminations.  
* Test time: 10±1 sec.  
* Vibration frequency: 10~55 Hz/min.  
* Total amplitude: 1.5mm  
8. Vibration  
Resistance  
* No remarkable damage.  
* Cap change and Q/D.F.: To meet initial spec.  
* Test time: 6 hrs. (Two hrs each in three mutually  
perpendicular directions.)  
* Cap./DF(Q) Measurement to be made after de-aging at  
150°C for 1hr then set for 24±2 hrs at room temp.  
9. Solderability  
10. Bending Test  
* Solder temperature: 235±5°C  
* Dipping time: 2±0.5 sec.  
95% min. coverage of all metalized area.  
* The middle part of substrate shall be pressurized by means  
of the pressurizing rod at a rate of about 1 mm per second until  
the deflection becomes 1 mm and then the pressure shall be  
maintained for 5±1 sec.  
* No remarkable damage.  
* Cap change: within ±5.0% or ±0.5pF whichever is larger.  
(This capacitance change means the change of capacitance under  
specified flexure of substrate from the capacitance measured before  
the test.)  
* Measurement to be made after keeping at room temp. for  
24±2 hrs.  
* Solder temperature: 260±5°C  
11. Resistance to  
Soldering Heat  
* No remarkable damage.  
* Dipping time: 10±1 sec  
* Cap change: within ±2.5% or ±0.25pF whichever is larger.  
* Q/D.F., I.R. and dielectric strength: To meet initial requirements.  
* 25% max. leaching on each edge.  
* Preheating: 120 to 150°C for 1 minute before imme rse the  
capacitor in a eutectic solder.  
* Cap. / DF(Q) / I.R. Measurement to be made after de-aging  
at 150°C for 1hr then set for 24±2 hrs at room temp .  
* "Room condition" Temperature: 15 to 35°C, Relativ e humidity: 25 to 75%, Atmospheric pressure: 86 to 106kPa.  
Page 9 of 13  
ASC_Microwave_High_Reliability_RH  
Feb. 2023  

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