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QTAN0016 PDF预览

QTAN0016

更新时间: 2024-02-21 01:42:43
品牌 Logo 应用领域
爱特美尔 - ATMEL /
页数 文件大小 规格书
4页 75K
描述
Diagnostic Modes for QT ICs

QTAN0016 数据手册

 浏览型号QTAN0016的Datasheet PDF文件第2页浏览型号QTAN0016的Datasheet PDF文件第3页浏览型号QTAN0016的Datasheet PDF文件第4页 
Diagnostic Modes for Products with Atmel®  
Capacitive-touch ICs  
1. Introduction  
There are many types of Atmel capacitive-touch integrated circuits (QTICs) with  
interfaces as diverse as simple pin-per-key (PPK) to serial links for data  
communication. To support product development throughout production testing, it is  
often useful to obtain data from the QT IC by using the diagnostic modes in a  
product’s main microcontroller (MCU).  
Diagnostic  
Modes for QT  
ICs  
This application note discusses the various points to be considered when designing  
diagnostic modes for your product.  
The topics in this application note include:  
• Diagnostic mode entry  
• Diagnostic data output  
• Displayed information  
• Pass-through from QT IC to PC  
• Production testing  
ApplicationNote  
QTAN0016  
2. Why Do I Need Diagnostics?  
Making diagnostic information readily available encourages monitoring and promotes  
understanding of the product under development. It also permits the detection of  
unusual conditions or, in the event of a fault, the retrieval of useful information while  
the fault condition prevails.  
3. Diagnostic Mode Entry  
There are three basic methods of initiating diagnostic mode during product testing:  
• Key sequence  
• External command  
• Option setting  
3.1  
Entry by Key Sequence  
Key sequences are particularly useful because external equipment or product  
modifications are not required. However, the method is not always successful if the  
touch is not calibrated or if an error condition occurs.  
A typical key sequence could be:  
1. Press key A for 3 seconds, then release.  
2. Press key B for 3 seconds, then release.  
3. Press key C for 3 seconds, then release.  
10704A–AT42–10/08  

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