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QTAN0016

更新时间： 2024-02-14 18:48:14

品牌	Logo	应用领域
爱特美尔 - ATMEL		/
页数	文件大小	规格书
4页	75K
描述
Diagnostic Modes for QT ICs

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QTAN0016 数据手册

Diagnostic Modes for Products with Atmel^®

Capacitive-touch ICs

1. Introduction

There are many types of Atmel capacitive-touch integrated circuits (QT^™ICs) with

interfaces as diverse as simple pin-per-key (PPK) to serial links for data

communication. To support product development throughout production testing, it is

often useful to obtain data from the QT IC by using the diagnostic modes in a

product’s main microcontroller (MCU).

Diagnostic

Modes for QT

ICs

This application note discusses the various points to be considered when designing

diagnostic modes for your product.

The topics in this application note include:

• Diagnostic mode entry

• Diagnostic data output

• Displayed information

• Pass-through from QT IC to PC

• Production testing

ApplicationNote

QTAN0016

2. Why Do I Need Diagnostics?

Making diagnostic information readily available encourages monitoring and promotes

understanding of the product under development. It also permits the detection of

unusual conditions or, in the event of a fault, the retrieval of useful information while

the fault condition prevails.

3. Diagnostic Mode Entry

There are three basic methods of initiating diagnostic mode during product testing:

• Key sequence

• External command

• Option setting

3.1

Entry by Key Sequence

Key sequences are particularly useful because external equipment or product

modifications are not required. However, the method is not always successful if the

touch is not calibrated or if an error condition occurs.

A typical key sequence could be:

1. Press key A for 3 seconds, then release.

2. Press key B for 3 seconds, then release.

3. Press key C for 3 seconds, then release.

10704A–AT42–10/08

12 3 4

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