Spec No.: JELF243B_9101M-01
P5/12
7. Electrical Performance
No.
Item
Specification
Meet chapter 3 ratings.
Meet chapter 3 ratings.
Test method
Measuring equipment: Keysight E4991A or the
equivalent
7.1 Inductance
7.2 Q
Measuring frequency: 100 MHz
Measuring conditions:
Measurement signal level: Approx. 0 dBm
Measurement terminal distance: 0.5 mm
Electrical length: 10 mm
Weight: Approx. 1 N to 5 N
Measuring fixture: Keysight 16197A
Position the chip coil under test as shown in the
measuring example below and connect it to the
electrode by applying weight.
Measurement example:
Measuring method: see "Electrical performance:
Measuring method for inductance/Q" in the Appendix.
Measuring equipment: digital multimeter
Measuring equipment: Keysight 8753C or the
equivalent
7.3 DC resistance
7.4 Self-resonant
frequency
Meet chapter 3 ratings.
Meet chapter 3 ratings.
7.5 Rated current
Product temperature rise: 25°C max.
Apply the rated current specified in chapter 3.
8. AEC-Q200 Requirement
8.1 Performance [based on table 5 for magnetics (inductors/transformer) AEC-Q200 Rev. D issued June 1,
2010]
AEC-Q200
Murata specification/deviation
No.
3
Stress
Test method
1000 h at 125°C
Set for 24 h at room condition, then
measured.
High
Meet table A after testing.
Table A
temperature
exposure
Appearance
No damage
Inductance change rate (at 100 MHz) Within ±10%
4
Temperature
cycling
1000 cycles
-40°C to +125°C
Meet table A after testing.
Set for 24 h at room condition, then
measured.
7
8
9
Biased humidity 1000 h at 85°C, 85% (RH). Unpowered. Meet table A after testing.
Set for 24 h at room condition, then
measured.
Operational life Apply 125°C 1000 h
Set for 24 h at room condition, then
Meet table A after testing.
measured.
External visual Visual inspection
No abnormalities
No defects
10 Physical
dimension
Meet chapter 5, "Appearance and
Dimensions".
12 Resistance to
solvents
Per MIL-STD-202
Method 215
Not applicable
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