LMH6714, LMH6720
LMH6722, LMH6722-Q1
www.ti.com
SNOSA39G –NOVEMBER 2002–REVISED APRIL 2013
Operating Ratings(1)
Thermal Resistance Package
5-Pin SOT-23 (DBV)
6-Pin SOT-23 (DBV)
8-Pin SOIC (D)
(θJA
)
232°C/W
198°C/W
145°C/W
14-Pin SOIC (D)
130°C/W
14-Pin TSSOP (PW)
14-Pin WSON (NHK)
Operating Temperature
160°C/W
46°C/W
LMH6722Q
All others
−40°C to 125°C
−40°C to 85°C
8V (±4V) to 12.5V (±6.25V)
Supply Voltage Range
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is intended to be functional, but specific performance is not ensured. For specific specifications, see the Electrical
Characteristics tables.
Electrical Characteristics
Unless specified, AV = +2, RF = 300Ω: VCC = ±5V, RL = 100Ω, LMH6714/LMH6720/LMH6722. Boldface limits apply at
temperature extremes.
Symbol
Parameter
Conditions
Min(1)
Typ(2)
Max(1)
Units
Frequency Domain Response
SSBW
LSBW
LSBW
−3dB Bandwidth
−3dB Bandwidth
VOUT = 0.5VPP
VOUT = 2.0VPP
VOUT = 2.0VPP
345
200
170
400
250
250
MHz
MHz
MHz
−3dB Bandwidth, LMH6722
TSSOP package only
Gain Flatness
Peaking
VOUT = 2VPP
GFP
GFR
LPD
DG
DC to 120MHz
DC to 120MHz
DC to 120MHz
0.1
0.1
dB
dB
deg
%
Rolloff
Linear Phase Deviation
Differential Gain
Differential Gain
Differential Phase
0.5
RL = 150Ω, 4.43MHz (LMH6714)
RL = 150Ω, 4.43MHz (LMH6720)
RL = 150Ω, 4.43MHz
0.01
0.02
0.01
DG
%
DP
deg
Time Domain Response
TRS
TRL
ts
Rise and Fall Time
.5V Step
2V Step
2V Step
6V Step
1.5
2.6
ns
ns
Settling Time to 0.05%
Slew Rate
12
ns
SR
1200
1800
V/µs
Distortion and Noise Response
HD2
HD3
IMD
2nd Harmonic Distortion
3rd Harmonic Distortion
2VPP, 20MHz
−58
−70
−78
dBc
dBc
dBc
2VPP, 20MHz
3rd Order Intermodulation
Products
10MHz, POUT = 0dBm
Equivalent Input Noise
Non-Inverting Voltage
Inverting Current
VN
>1MHz
>1MHz
>1MHz
3.4
10
nV/√Hz
pA/√Hz
pA/√Hz
NICN
ICN
Non-Inverting Current
1.2
(1) All limits are specified by testing, design, or statistical analysis.
(2) Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and
will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production
material.
Copyright © 2002–2013, Texas Instruments Incorporated
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