D A T A S H E E T
TABLE OF CONTENTS
Continuity of Specifications ....................................1
For More Information ..............................................1
General Description . . . . . . . . . . . . . . . . . . . . . . . . 4
Product Selector Guide . . . . . . . . . . . . . . . . . . . . . 6
Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . . 7
Pin Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Ordering Information . . . . . . . . . . . . . . . . . . . . . . 10
Standard Products ................................................10
Table 1. Am29LV033C Device Bus Operations ..........11
Requirements for Reading Array Data .................11
Writing Commands/Command Sequences ..........11
Accelerated Program Operation ...........................12
Program and Erase Operation Status ..................12
Standby Mode ......................................................12
Automatic Sleep Mode .........................................12
RESET#: Hardware Reset Pin .............................12
Output Disable Mode ............................................13
Table 2. Am29LV033C Sector Address Table ............13
Autoselect Mode ...................................................15
Table 3. Am29LV033C Autoselect Codes
DQ7: Data# Polling ............................................... 26
Figure 5. Data# Polling Algorithm................................ 26
RY/BY#: Ready/Busy# ......................................... 27
DQ6: Toggle Bit I .................................................. 27
DQ2: Toggle Bit II ................................................. 27
Reading Toggle Bits DQ6/DQ2 ............................ 27
DQ5: Exceeded Timing Limits .............................. 28
DQ3: Sector Erase Timer ..................................... 28
Figure 6. Toggle Bit Algorithm..................................... 28
Table 10. Write Operation Status ................................29
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 31
CMOS Compatible ............................................... 31
Zero Power Flash ................................................. 32
Figure 9. ICC1 Current vs. Time (Showing Active
and Automatic Sleep Currents) ................................... 32
Figure 10. Typical ICC1 vs. Frequency ......................... 32
Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Figure 11. Test Setup.................................................. 33
Table 11. Test Specifications ......................................33
Figure 12. Input Waveforms and
Measurement Levels................................................... 33
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 34
Read Operations .................................................. 34
Figure 13. Read Operations Timings .......................... 34
Hardware Reset (RESET#) .................................. 35
Figure 14. RESET# Timings........................................ 35
Erase/Program Operations ................................... 36
Figure 15. Program Operation Timings....................... 37
Figure 16. Accelerated Program Timing Diagram....... 37
Figure 17. Chip/Sector Erase Operation Timings........ 38
Figure 18. Data# Polling Timings (During
(High Voltage Method) ................................................15
Sector/Sector Block Protection and Unprotection 15
Table 4. Sector Block Addresses for
Protection/Unprotection ...............................................16
Figure 1. Temporary Sector Unprotect Operation....... 16
Figure 2. In-System Sector Protect/
Unprotect Algorithms................................................... 17
Hardware Data Protection ....................................18
Low VCC Write Inhibit ............................................18
Write Pulse “Glitch” Protection .............................18
Logical Inhibit .......................................................18
Power-Up Write Inhibit .........................................18
Table 5. CFI Query Identification String ......................18
Table 6. System Interface String .................................19
Table 7. Device Geometry Definition ..........................19
Table 8. Primary Vendor-Specific Extended Query ....20
Reading Array Data ..............................................21
Reset Command ..................................................21
Autoselect Command Sequence ..........................21
Byte Program Command Sequence .....................21
Unlock Bypass Command Sequence ...................22
Accelerated Program Operations .........................22
Figure 3. Program Operation ...................................... 22
Chip Erase Command Sequence .........................22
Sector Erase Command Sequence ......................23
Erase Suspend/Erase Resume Commands .........23
Figure 4. Erase Operation........................................... 24
Table 9. Am29LV033C Command Definitions ...........25
Embedded Algorithms)................................................ 39
Figure 19. Toggle Bit Timings (During
Embedded Algorithms)................................................ 39
Figure 20. DQ2 vs. DQ6.............................................. 39
Figure 21. Temporary Sector/Sector
Block Unprotect Timing Diagram................................. 40
Figure 22. Sector Protect/Unprotect
Timing Diagram........................................................... 41
Figure 23. Alternate CE# Controlled Write
Operation Timings....................................................... 43
Erase and Programming Performance . . . . . . . 44
Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . 45
TS 040—40-Pin Standard TSOP ......................... 45
TSR040—40-Pin Reverse TSOP ........................ 46
FBD063—63-Ball Fine-Pitch Ball Grid Array
(FBGA) 8 x 14 mm ............................................... 47
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 48
22268B5 September 12, 2006
Am29LV033C
3
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