Datasheet > HRG3216P-1001-B-T5

HRG3216P-1001-B-T5

更新时间： 2022-09-29 12:37:01

品牌	Logo	应用领域
其他 - ETC		/
页数	文件大小	规格书
2页	222K
描述
RES SMD 1K OHM 0.1% 1W 1206

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HRG3216P-1001-B-T5 数据手册

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Reliability specification

◆

Standard

Test items

Condition (test methods (JIS C5201-1)

≦47Ω

≧47Ω

70℃, rated voltage, ¹90min on 30min oﬀ, 1000hours

±（0.5％+0.05Ω） ±（0.25％+0.01Ω）

±（0.25％+0.05Ω） ±（0.1％+0.01Ω）

Life (biased)

High temperature high humidity

Temperature shock

85℃, 85%RH, 1/10 of rated power, 90min on 30min oﬀ, 1000hours

-55℃ (30min) ～ 125℃ (30min) 1000cycles

155℃, no bias, 1000hours

High temperature exposure

Resistance to soldering heat

260±5℃, 10 seconds (reﬂow)

*1 Rated voltage is given by E= R x P

E= rated voltage (V), R=nominal resistance value(Ω), P=rated power(W)

If rated voltage exceeds maximum voltage /element, maximum voltage/element is the rated voltage.

Reliability test data

◆

Biased life test

High temperature high humidity (biased)

○

0.12

0.10

Load Life @ 70℃ at

Temperature Humidity Bias

0.08

Rated Power 1.0Wꢀn = 4

0.1W n = 25

0.06

0.04

0.02

0.00

-0.02

-0.04

-0.06

-0.08

-0.10

-0.12

0.06

0.04

0.02

0.00

-0.02

-0.04

-0.06

HRG3216：10kΩ

-0.08

-0.10

-0.12

10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ1000ꢀꢀꢀꢀꢀꢀꢀ10000

Test duration(h)

10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ1000ꢀꢀꢀꢀꢀꢀꢀ10000

Test duration(h)

Temperature shock

High temperature exposure

○

0.12

0.10

Thermal Shock

High Temperature Exposure

0.08

-55℃ - +125℃ n = 25

at 155℃ with no power n = 25

0.06

0.04

0.02

0.00

-0.02

-0.04

-0.06

0.06

0.04

0.02

0.00

-0.02

-0.04

-0.06

HRG3216：10kΩ

-0.08

-0.10

-0.12

10ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ 100ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀ1000ꢀꢀꢀꢀꢀꢀꢀ10000

Test duration(h)

Derating Curve

◆

100

-55ꢀꢀꢀꢀ 0ꢀꢀꢀꢀꢀ50ꢀ70ꢀꢀ100ꢀꢀꢀꢀꢀ155

Ambient temperature (℃)

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