■ Specifications and Test Methods
Specification
Test Method
(Ref. Standard:JIS C 5101, IEC60384）
No
1
Item
Rated Voltage
Temperature
Compensating Type
Shown in Rated value.
High Dielectric
Constant Type
The rated voltage is defined as the maximum voltage
which may be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage,
VP-P or VO-P, whichever is larger, should be maintained
within the rated voltage range.
2
3
4
Appearance
Dimension
No defects or abnormalities.
Visual inspection.
Within the specified dimensions.
No defects or abnormalities.
Using calipers. (GRM02 size is based on Microscope)
Voltage proof
Measurement Point
Test Voltage
:
Between the terminations
300% of the rated voltage
(Temperature compensating type)
250% of the rated voltage
(High dielectric constant type)
: 1s to 5 s
:
Applied Time
Charge/discharge current : 50mA max.
5
Insulation Resistance(I.R.)
C≦0.047µF:More than 10000MΩ
C＞0.047µF:More than 500Ω·F
C:Nominal Capacitance
Measurement Point ꢀꢀ : Between the terminations
Measurement Voltage : DC Rated Voltage
Charging Time
: 2 min
Charge/discharge current : 50mA max.
Measurement Temperature : Room Temperature
Measurement Temperature : Room Temperature
6
7
Capacitance
Shown in Rated value.
(1)Temperature Compensating Type
Q or Dissipation Factor (D.F.)
30pF and over:Q≧1000
W.V.:100Vdc :0.025max.(C<0.068µF)
Capacitance
C≦1000pF
C＞1000pF
Frequency
1.0+/-0.1MHz 0.5 to 5.0Vrms
1.0+/-0.1kHz
Voltage
30pF and below:Q≧400+20C
:0.05max.(C≧0.068µF)
1.0+/-0.2Vrms
C:Nominal Capacitance(pF) W.V.:50/35/25Vdc :0.025max.
W.V.:16/10Vdc :0.035max.
(2)High Dielectric Constant Type
W.V.:6.3/4Vdc :0.05max.(C<3.3µF)
:0.1max. (C≧3.3µF)
Capacitance
C≦10μF
C＞10μF
Frequency
1.0+/-0.1kHz
120+/-24Hz
Voltage
1.0+/-0.2Vrms
0.5+/-0.1Vrms
8
Temperature
No bias
Nominal values of the
temperature coefficient is
shown in Rated value.
B1,B3 : Within +/-10%
ꢀꢀ (-25°C to +85°C)
R1,R7 : Within +/-15%
ꢀꢀ (-55°C to +125°C)
The capacitance change should be measured after 5 min
at each specified temp. stage.
Characteristics
of Capacitance
In case of applying voltage, the capacitance change should be
measured after 1 min with applying voltage in equilibration of
each temp. stage.
But,the Capacitance Change R6 : Within +/-15%
under 20℃ is shown
ꢀ
(-55°C to +85°C)
Capacitance value as a reference is the value in step 3.
in Table A.
C7 : Within +/-22%
ꢀ
(-55°C to +125°C)
(1)Temperature Compensating Type
C8 : Within +/-22%
The capacitance drift is calculated by dividing the differences
between the maximum and minimum measured values in the
step 1,3 and 5 by the cap. value in step 3.
Capacitance Drift *
ꢀ (-55°C to +105°C)
Within +/-0.2% or +/-0.05pF L8 : Within +/-15%
(Whichever is larger.)
*Not apply to 1X/25V
ꢀ (-55°C to +125°C)
Step
Temperature(C)
Reference Temp.+/-2
Min. Operating Temp.+/-3
Reference Temp.+/-2
Max. Operating Temp.+/-3
Reference Temp.+/-2
: Within +15/-40%
1
2
3
4
5
ꢀ
(+125°C to +150°C)
50% of
-
B1 : Within +10/-30%
R1 : Within +15/-40%
(2)High Dielectric Constant Type
the rated
voltage
Applying Voltage(VDC)
No bias
Step
1
Temperature(C)
Reference Temp.+/-2
Min.Operating Temp.+/-3
Reference Temp.+/-2
Max.Operating Temp.+/-3
Reference Temp.+/-2
Min.Operating Temp.+/-3
Reference Temp.+/-2
Max.Operating Temp.+/-3
2
3
4
5
50% of
the rated voltage
(For B1,R1)
6
7
8
· Initial measurement for high dielectric constant type
Perform a heat treatment at 150+0/-10°C for 1h and then
let sit for 24+/-2h at room temperature, then measure.
9
Adhesive Strength
of Termination
No removal of the terminations or other defect
should occur.
Solder the capacitor on the test substrate shown in Fig.3.
Type
Applied Force(N)
GRM02
1
2
GRM03
GRM15/GRM18
5
GRM21/GRM31/GRM32
10
Holding Time
:
10+/-1s
Applied Direction : In parallel with the test substrate and vertical with
the capacitor side.
JEMCGS-0001U
2
5秒后页面跳转
TLP250光耦合器：资料手册参数分析
DA14580 低功耗蓝牙系统级芯片(SoC)：资料手册参数分析
INA226 高精度电流和功率监控器：资料手册参数分析
SI2302 N沟道MOSFET：资料手册参数分析
微信公众号
抖音公众号
浙公网安备 33010502006866号 浙ICP备10014259号-119
营业执照ICP证
数据手册
如果您发现信息不准确，
